DOI: 10.1016/s0169-4332(96)00215-2. Hot-electron scattering at Schottky interfaces measured by temperature dependent ballistic electron emission microscopy

Hot-electron scattering at Schottky interfaces measured by temperature dependent ballistic electron emission microscopy

10.1016/s0169-4332(96)00215-2

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Ventrice, C. A., LaBella, V. P., Ramaswamy, G., Yu, H.-P., & Schowalter, L. J. (1996). Hot-electron scattering at Schottky interfaces measured by temperature dependent ballistic electron emission microscopy. Applied Surface Science, 104â105, 274â281.

Authors 5

C.A. Ventrice (first)
V.P. LaBella (additional)
G. Ramaswamy (additional)
H.-P. Yu (additional)
L.J. Schowalter (additional)

References 16 Referenced 10

10.1103/PhysRevLett.61.2368 / Phys. Rev. Lett. by Bell (1988)
10.1103/PhysRevB.43.9308 / Phys. Rev. B by Schowalter (1991)
10.1116/1.586973 / J. Vac. Sci. Technol. B by Lee (1993)
10.1103/PhysRevB.46.12826 / Phys. Rev. B by Milliken (1992)
{'key': '10.1016/S0169-4332(96)00215-2_BIB5', 'first-page': '2679', 'volume': '69', 'author': 'Fernandez', 'year': '1990', 'journal-title': 'Appl. Phys. Lett.'} / Appl. Phys. Lett. by Fernandez (1990)
10.1116/1.587775 / J. Vac. Sci. Technol. B by Cuberes (1994)
10.1103/PhysRevLett.71.1760 / Phys. Rev. Lett. by Ludeke (1993)
10.1103/PhysRevLett.71.149 / Phys. Rev. Lett. by Bauer (1993)
10.1103/PhysRevLett.66.2511 / Phys. Rev. Lett. by Prietsch (1991)
10.1016/0039-6028(87)90141-5 / Surf. Sci. by Kaiser (1987)
Lake Shore Cryotronics, C-1 coax cable, part No. 9002-002-025.
{'key': '10.1016/S0169-4332(96)00215-2_BIB12', 'series-title': 'Scanning Tunneling Microscopy', 'author': 'Bell', 'year': '1993'} / Scanning Tunneling Microscopy by Bell (1993)
10.1016/0038-1101(64)90088-7 / Solid State Electron. by Sze (1964)
10.1016/0039-6028(79)90328-5 / Surf. Sci. by Oura (1979)
10.1016/0038-1101(65)90164-4 / Solid State Electron. by Crowell (1965)
10.1063/1.349453 / J. Appl. Phys. by Lee (1991)

Dates

Type	When
Created	22 years, 4 months ago (April 24, 2003, 9:34 a.m.)
Deposited	6 years, 4 months ago (April 14, 2019, 8:51 p.m.)
Indexed	1 year, 1 month ago (July 3, 2024, 7:03 a.m.)
Issued	29 years ago (Sept. 1, 1996)
Published	29 years ago (Sept. 1, 1996)
Published Print	29 years ago (Sept. 1, 1996)

Funders 0

None

BibTeX

@article{Ventrice_1996, title={Hot-electron scattering at Schottky interfaces measured by temperature dependent ballistic electron emission microscopy}, volume={104–105}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/s0169-4332(96)00215-2}, DOI={10.1016/s0169-4332(96)00215-2}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Ventrice, C.A. and LaBella, V.P. and Ramaswamy, G. and Yu, H.-P. and Schowalter, L.J.}, year={1996}, month=sep, pages={274–281} }

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