DOI: 10.1016/s0169-4332(03)00697-4. X-ray photoelectron spectroscopy study of MoTe2 single crystals and thin films

X-ray photoelectron spectroscopy study of MoTe2 single crystals and thin films

10.1016/s0169-4332(03)00697-4

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

BernÃ¨de, J. C., Amory, C., Assmann, L., & Spiesser, M. (2003). X-ray photoelectron spectroscopy study of MoTe2 single crystals and thin films. Applied Surface Science, 219(3â4), 238â248.

Authors 4

J.C Bernède (first)
C Amory (additional)
L Assmann (additional)
M Spiesser (additional)

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Dates

Type	When
Created	22 years, 1 month ago (July 7, 2003, 9:47 a.m.)
Deposited	6 years, 5 months ago (March 18, 2019, 5 a.m.)
Indexed	2 days, 2 hours ago (Aug. 21, 2025, 1:58 p.m.)
Issued	21 years, 8 months ago (Dec. 1, 2003)
Published	21 years, 8 months ago (Dec. 1, 2003)
Published Print	21 years, 8 months ago (Dec. 1, 2003)

Funders 0

None

BibTeX

@article{Bern_de_2003, title={X-ray photoelectron spectroscopy study of MoTe2 single crystals and thin films}, volume={219}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/s0169-4332(03)00697-4}, DOI={10.1016/s0169-4332(03)00697-4}, number={3–4}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Bernède, J.C and Amory, C and Assmann, L and Spiesser, M}, year={2003}, month=dec, pages={238–248} }

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