DOI: 10.1016/s0169-4332(02)01484-8. Amplitude or frequency modulation-detection in Kelvin probe force microscopy

Amplitude or frequency modulation-detection in Kelvin probe force microscopy

10.1016/s0169-4332(02)01484-8

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Glatzel, T., Sadewasser, S., & Lux-Steiner, M. C. (2003). Amplitude or frequency modulation-detection in Kelvin probe force microscopy. Applied Surface Science, 210(1â2), 84â89.

Authors 3

Th Glatzel (first)
S Sadewasser (additional)
M.Ch Lux-Steiner (additional)

References 22 Referenced 204

10.1116/1.585423 / J. Vac. Sci. Technol. B by Weaver (1991)
10.1063/1.113780 / Appl. Phys. Lett. by Kikukawa (1995)
10.1063/1.1146874 / Rev. Sci. Instrum. by Kikukawa (1996)
10.1063/1.121577 / Appl. Phys. Lett. by Kitamura (1998)
10.1016/S0169-4332(98)00538-8 / Appl. Surf. Sci. by Kitamura (1999)
10.1063/1.124357 / Appl. Phys. Lett. by Sommerhalter (1999)
Th. Glatzel, S. Sadewasser, R. Shikler, Y. Rosenwaks, M.Ch. Lux-Steiner, Mater. Sci. Eng. B, in press.
10.1063/1.1471375 / Appl. Phys. Lett. by Sadewasser (2002)
10.1063/1.1506205 / Appl. Phys. Lett. by Glatzel (2002)
10.1016/S0039-6028(01)00878-0 / Surf. Sci. by Sommerhalter (2001)
10.1016/S0169-4332(99)00537-1 / Appl. Surf. Sci. by Sommerhalter (2000)
10.1063/1.347347 / J. Appl. Phys. by Albrecht (1991)
10.1063/1.118910 / Appl. Phys. Lett. by Giessibl (1997)
10.1103/PhysRevB.56.16010 / Phys. Rev. B by Giessibl (1997)
10.1016/S0169-4332(98)00553-4 / Appl. Surf. Sci. by Giessibl (1999)
10.1063/1.358616 / J. Appl. Phys. by Hudlet (1995)
Park Scientific Instruments, Distributed by ATOS, http://www.atos-online.de.
Molecular Devices, Tools for Nanotechnology, Distributed by ANFATEC, http://www.anfatec.de.
Nanosensors, Distributed by L.O.T. Oriel, http://www.lot-oriel.com.
10.1063/1.123983 / Appl. Phys. Lett. by Shikler (1999)
10.1063/1.370706 / J. Appl. Phys. by Shikler (1999)
10.1063/1.368181 / J. Appl. Phys. by Jacobs (1998)

Dates

Type	When
Created	22 years, 5 months ago (March 14, 2003, 3:02 a.m.)
Deposited	6 years, 4 months ago (March 30, 2019, 12:23 a.m.)
Indexed	2 months, 1 week ago (June 14, 2025, 11:10 a.m.)
Issued	22 years, 5 months ago (March 1, 2003)
Published	22 years, 5 months ago (March 1, 2003)
Published Print	22 years, 5 months ago (March 1, 2003)

Funders 0

None

BibTeX

@article{Glatzel_2003, title={Amplitude or frequency modulation-detection in Kelvin probe force microscopy}, volume={210}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/s0169-4332(02)01484-8}, DOI={10.1016/s0169-4332(02)01484-8}, number={1–2}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Glatzel, Th and Sadewasser, S and Lux-Steiner, M.Ch}, year={2003}, month=mar, pages={84–89} }

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