DOI: 10.1016/s0169-4332(01)01013-3. Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials

Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials

10.1016/s0169-4332(01)01013-3

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Okazaki, N., Odagawa, H., Cho, Y., Nagamura, T., Komiyama, D., Koida, T., Minami, H., Ahmet, P., Fukumura, T., Matsumoto, Y., Kawasaki, M., Chikyow, T., Koinuma, H., & Hasegawa, T. (2002). Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials. Applied Surface Science, 189(3â4), 222â226.

Authors 14

Noriaki Okazaki (first)
Hiroyuki Odagawa (additional)
Yasuo Cho (additional)
Toshihiko Nagamura (additional)
Daisuke Komiyama (additional)
Takashi Koida (additional)
Hideki Minami (additional)
Parhat Ahmet (additional)
Tomoteru Fukumura (additional)
Yuji Matsumoto (additional)
Masashi Kawasaki (additional)
Toyohiro Chikyow (additional)
Hideomi Koinuma (additional)
Tetsuya Hasegawa (additional)

References 14 Referenced 24

10.1063/1.1146936 / Rev. Sci. Instrum. by Cho (1996)
10.1063/1.115773 / Appl. Phys. Lett. by Wei (1996)
10.1126/science.276.5321.2004 / Science by Lu (1997)
10.1063/1.119776 / Appl. Phys. Lett. by Takeuchi (1997)
10.1063/1.121316 / Appl. Phys. Lett. by Chang (1998)
10.1143/JJAP.36.3152 / Jpn. J. Appl. Phys. by Cho (1997)
10.1143/JJAP.37.3132 / Jpn. J. Appl. Phys. by Cho (1998)
10.1143/JJAP.38.3279 / Jpn. J. Appl. Phys. by Cho (1999)
10.1143/JJAP.38.5689 / Jpn. J. Appl. Phys. by Cho (1999)
10.1063/1.125165 / Appl. Phys. Lett. by Cho (1999)
10.1143/JJAP.39.3086 / Jpn. J. Appl. Phys. by Cho (2000)
10.1143/JJAP.39.3808 / Jpn. J. Appl. Phys. by Odagawa (2000)
10.1021/ac60214a047 / Anal. Chem. by Savitzky (1964)
P. Ahmet, T. Koida, M. Takakura, K. Nakajima, M. Yoshimoto, H. Koinuma, M. Tanaka, M. Takeguchi, T. Chikyow, Appl. Surf. Sci. 2002.

Dates

Type	When
Created	22 years, 10 months ago (Oct. 14, 2002, 5:01 a.m.)
Deposited	6 years, 3 months ago (May 3, 2019, 1:28 a.m.)
Indexed	1 year, 6 months ago (Feb. 11, 2024, 6:41 a.m.)
Issued	23 years, 5 months ago (April 1, 2002)
Published	23 years, 5 months ago (April 1, 2002)
Published Print	23 years, 5 months ago (April 1, 2002)

Funders 0

None

BibTeX

@article{Okazaki_2002, title={Development of scanning microwave microscope with a lumped-constant resonator probe for high-throughput characterization of combinatorial dielectric materials}, volume={189}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/s0169-4332(01)01013-3}, DOI={10.1016/s0169-4332(01)01013-3}, number={3–4}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Okazaki, Noriaki and Odagawa, Hiroyuki and Cho, Yasuo and Nagamura, Toshihiko and Komiyama, Daisuke and Koida, Takashi and Minami, Hideki and Ahmet, Parhat and Fukumura, Tomoteru and Matsumoto, Yuji and Kawasaki, Masashi and Chikyow, Toyohiro and Koinuma, Hideomi and Hasegawa, Tetsuya}, year={2002}, month=apr, pages={222–226} }

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