Crossref journal-article
Elsevier BV
Applied Surface Science (78)
Bibliography

Bischoff, L., Teichert, J., & Heera, V. (2001). Focused ion beam sputtering investigations on SiC. Applied Surface Science, 184(1–4), 372–376.

Authors 3
  1. L. Bischoff (first)
  2. J. Teichert (additional)
  3. V. Heera (additional)
References 19 Referenced 24
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Dates
Type When
Created 22 years, 10 months ago (Oct. 14, 2002, 9:01 a.m.)
Deposited 2 years, 4 months ago (April 6, 2023, 3:32 a.m.)
Indexed 2 months, 1 week ago (June 18, 2025, 7:45 a.m.)
Issued 23 years, 8 months ago (Dec. 1, 2001)
Published 23 years, 8 months ago (Dec. 1, 2001)
Published Print 23 years, 8 months ago (Dec. 1, 2001)
Funders 0

None

@article{Bischoff_2001, title={Focused ion beam sputtering investigations on SiC}, volume={184}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/s0169-4332(01)00520-7}, DOI={10.1016/s0169-4332(01)00520-7}, number={1–4}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Bischoff, L. and Teichert, J. and Heera, V.}, year={2001}, month=dec, pages={372–376} }