DOI: 10.1016/s0167-9317(99)00400-1. Investigation of SOI MOSFETs with ultimate thickness

Investigation of SOI MOSFETs with ultimate thickness

10.1016/s0167-9317(99)00400-1

Crossref journal-article

Elsevier BV

Microelectronic Engineering (78)

Bibliography

Ernst, T., Munteanu, D., Cristoloveanu, S., Ouisse, T., Horiguchi, S., Ono, Y., Takahashi, Y., & Murase, K. (1999). Investigation of SOI MOSFETs with ultimate thickness. Microelectronic Engineering, 48(1â4), 339â342.

Authors 8

T. Ernst (first)
D. Munteanu (additional)
S. Cristoloveanu (additional)
T. Ouisse (additional)
S. Horiguchi (additional)
Y. Ono (additional)
Y. Takahashi (additional)
K. Murase (additional)

References 9 Referenced 21

{'key': '10.1016/S0167-9317(99)00400-1_BIB1', 'series-title': 'Electrical Characterization of Silicon-On-Insulator Materials and Devices', 'author': 'Cristoloveanu', 'year': '1995'} / Electrical Characterization of Silicon-On-Insulator Materials and Devices by Cristoloveanu (1995)
{'key': '10.1016/S0167-9317(99)00400-1_BIB2', 'series-title': 'IEEE EDL', 'first-page': '410', 'author': 'Balestra', 'year': '1987'} / IEEE EDL by Balestra (1987)
10.1016/S0038-1101(98)00061-6 / Solid-State Electr. by Baie (1998)
{'key': '10.1016/S0167-9317(99)00400-1_BIB4', 'series-title': 'IEDM', 'first-page': '815', 'author': 'Fiegna', 'year': '1996'} / IEDM by Fiegna (1996)
10.1063/1.358382 / J. Appl. Phys. by Ouisse (1994)
10.1109/55.260792 / IEEE EDL by Omura (1993)
10.1109/55.468289 / IEEE EDL by Choi (1995)
{'key': '10.1016/S0167-9317(99)00400-1_BIB8', 'first-page': '5899', 'volume': 'C-15', 'author': 'Ridley', 'year': '1982', 'journal-title': 'J. Phys.'} / J. Phys. by Ridley (1982)
10.1063/1.366480 / J. Appl. Phys. by Shoji (1997)

Dates

Type	When
Created	23 years ago (July 25, 2002, 10:07 p.m.)
Deposited	6 years, 4 months ago (April 14, 2019, 8:57 p.m.)
Indexed	4 months, 4 weeks ago (March 24, 2025, 2:30 a.m.)
Issued	25 years, 11 months ago (Sept. 1, 1999)
Published	25 years, 11 months ago (Sept. 1, 1999)
Published Print	25 years, 11 months ago (Sept. 1, 1999)

Funders 0

None

BibTeX

@article{Ernst_1999, title={Investigation of SOI MOSFETs with ultimate thickness}, volume={48}, ISSN={0167-9317}, url={http://dx.doi.org/10.1016/s0167-9317(99)00400-1}, DOI={10.1016/s0167-9317(99)00400-1}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Ernst, T. and Munteanu, D. and Cristoloveanu, S. and Ouisse, T. and Horiguchi, S. and Ono, Y. and Takahashi, Y. and Murase, K.}, year={1999}, month=sep, pages={339–342} }

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