10.1016/s0167-9317(97)00050-6
Crossref journal-article
Elsevier BV
Microelectronic Engineering (78)
Bibliography

Alessandri, M., Clementi, C., Crivelli, B., Ghidini, G., Pellizzer, F., Martin, F., Imai, M., & Ikegawa, H. (1997). Nitridation impact on thin oxide charge trapping. Microelectronic Engineering, 36(1–4), 211–214.

Authors 8
  1. M. Alessandri (first)
  2. C. Clementi (additional)
  3. B. Crivelli (additional)
  4. G. Ghidini (additional)
  5. F. Pellizzer (additional)
  6. F. Martin (additional)
  7. M. Imai (additional)
  8. H. Ikegawa (additional)
References 6 Referenced 9
  1. {'key': '10.1016/S0167-9317(97)00050-6_BIB1', 'series-title': '7th ESPRIT Workshop on Diel. in Microel', 'author': 'Ghidini', 'year': '1995'} / 7th ESPRIT Workshop on Diel. in Microel by Ghidini (1995)
  2. {'key': '10.1016/S0167-9317(97)00050-6_BIB2', 'first-page': '645', 'article-title': 'The Physics and Chemistry of SiO2 and the SiSiO2 Interfaces', 'author': 'Ghidini', 'year': '1996'} / The Physics and Chemistry of SiO2 and the SiSiO2 Interfaces by Ghidini (1996)
  3. 10.1063/1.323212 / J. Appl. Phys. by Dimaria (1976)
  4. 10.1016/0038-1101(94)90017-5 / Solid State Elec. by Papadas (1994)
  5. 10.1063/1.324253 / J. Appl. Phys. by Solomon (1977)
  6. 10.1016/0038-1101(70)90073-0 / Solid State Electronics by Kuhn (1970)
Dates
Type When
Created 23 years, 1 month ago (July 25, 2002, 6:48 p.m.)
Deposited 6 years, 4 months ago (April 18, 2019, 4:26 p.m.)
Indexed 1 year ago (Aug. 7, 2024, 1:13 p.m.)
Issued 28 years, 2 months ago (June 1, 1997)
Published 28 years, 2 months ago (June 1, 1997)
Published Print 28 years, 2 months ago (June 1, 1997)
Funders 0

None

@article{Alessandri_1997, title={Nitridation impact on thin oxide charge trapping}, volume={36}, ISSN={0167-9317}, url={http://dx.doi.org/10.1016/s0167-9317(97)00050-6}, DOI={10.1016/s0167-9317(97)00050-6}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Alessandri, M. and Clementi, C. and Crivelli, B. and Ghidini, G. and Pellizzer, F. and Martin, F. and Imai, M. and Ikegawa, H.}, year={1997}, month=jun, pages={211–214} }