Crossref
journal-article
Elsevier BV
Microelectronic Engineering (78)
References
6
Referenced
9
{'key': '10.1016/S0167-9317(97)00050-6_BIB1', 'series-title': '7th ESPRIT Workshop on Diel. in Microel', 'author': 'Ghidini', 'year': '1995'}
/ 7th ESPRIT Workshop on Diel. in Microel by Ghidini (1995){'key': '10.1016/S0167-9317(97)00050-6_BIB2', 'first-page': '645', 'article-title': 'The Physics and Chemistry of SiO2 and the SiSiO2 Interfaces', 'author': 'Ghidini', 'year': '1996'}
/ The Physics and Chemistry of SiO2 and the SiSiO2 Interfaces by Ghidini (1996)10.1063/1.323212
/ J. Appl. Phys. by Dimaria (1976)10.1016/0038-1101(94)90017-5
/ Solid State Elec. by Papadas (1994)10.1063/1.324253
/ J. Appl. Phys. by Solomon (1977)10.1016/0038-1101(70)90073-0
/ Solid State Electronics by Kuhn (1970)
Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 25, 2002, 6:48 p.m.) |
Deposited | 6 years, 4 months ago (April 18, 2019, 4:26 p.m.) |
Indexed | 1 year ago (Aug. 7, 2024, 1:13 p.m.) |
Issued | 28 years, 2 months ago (June 1, 1997) |
Published | 28 years, 2 months ago (June 1, 1997) |
Published Print | 28 years, 2 months ago (June 1, 1997) |
@article{Alessandri_1997, title={Nitridation impact on thin oxide charge trapping}, volume={36}, ISSN={0167-9317}, url={http://dx.doi.org/10.1016/s0167-9317(97)00050-6}, DOI={10.1016/s0167-9317(97)00050-6}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Alessandri, M. and Clementi, C. and Crivelli, B. and Ghidini, G. and Pellizzer, F. and Martin, F. and Imai, M. and Ikegawa, H.}, year={1997}, month=jun, pages={211–214} }