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Ebert, Ph. (1999). Nano-scale properties of defects in compound semiconductor surfaces. Surface Science Reports, 33(4–8), 121–303.

Authors 1
  1. Ph. Ebert (first)
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Dates
Type When
Created 22 years, 9 months ago (Oct. 31, 2002, 4:53 p.m.)
Deposited 6 years, 3 months ago (April 25, 2019, 3:25 p.m.)
Indexed 3 days, 6 hours ago (Aug. 20, 2025, 9:21 a.m.)
Issued 26 years, 7 months ago (Jan. 1, 1999)
Published 26 years, 7 months ago (Jan. 1, 1999)
Published Print 26 years, 7 months ago (Jan. 1, 1999)
Funders 0

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@article{Ebert_1999, title={Nano-scale properties of defects in compound semiconductor surfaces}, volume={33}, ISSN={0167-5729}, url={http://dx.doi.org/10.1016/s0167-5729(98)00011-9}, DOI={10.1016/s0167-5729(98)00011-9}, number={4–8}, journal={Surface Science Reports}, publisher={Elsevier BV}, author={Ebert, Ph.}, year={1999}, month=jan, pages={121–303} }