DOI: 10.1016/s0042-207x(97)00150-4. Identification of induced reaction during XPS depth profile measurements of films grown by ion beam epitaxy

Identification of induced reaction during XPS depth profile measurements of films grown by ion beam epitaxy

10.1016/s0042-207x(97)00150-4

Crossref journal-article

Elsevier BV

Vacuum (78)

Bibliography

Wu, Z., Huang, D., Yang, X., Wang, J., Qin, F., Zhang, J., & Yang, Z. (1998). Identification of induced reaction during XPS depth profile measurements of films grown by ion beam epitaxy. Vacuum, 49(2), 133â137.

Authors 7

Z Wu (first)
D Huang (additional)
X Yang (additional)
J Wang (additional)
F Qin (additional)
J Zhang (additional)
Z Yang (additional)

References 7 Referenced 11

10.1143/JJAP.34.L688 / Japan. J. Appl. Phys by Yoshimoto (1995)
10.1002/sia.7401601107 / Surf. and Inter. Anal. by Ingo (1990)
10.1063/1.115362 / Appl. Phys. Lett. by Huang (1995)
10.1116/1.577638 / J. Vac. Sci. Technol. by Paparazzo (1991)
10.1116/1.577572 / J. Vac. Sci. Technol. by Vancauwenberghe (1991)
10.1116/1.579890 / J. Vac. Sci. Technol. by Park (1996)
10.1016/S0042-207X(97)00151-6 / Vacuum by Yang (1998)

Dates

Type	When
Created	22 years, 3 months ago (May 12, 2003, 8:52 p.m.)
Deposited	6 years, 4 months ago (April 28, 2019, 8:58 p.m.)
Indexed	1 year, 1 month ago (June 29, 2024, 6:50 p.m.)
Issued	27 years, 6 months ago (Feb. 1, 1998)
Published	27 years, 6 months ago (Feb. 1, 1998)
Published Print	27 years, 6 months ago (Feb. 1, 1998)

Funders 0

None

BibTeX

@article{Wu_1998, title={Identification of induced reaction during XPS depth profile measurements of films grown by ion beam epitaxy}, volume={49}, ISSN={0042-207X}, url={http://dx.doi.org/10.1016/s0042-207x(97)00150-4}, DOI={10.1016/s0042-207x(97)00150-4}, number={2}, journal={Vacuum}, publisher={Elsevier BV}, author={Wu, Z and Huang, D and Yang, X and Wang, J and Qin, F and Zhang, J and Yang, Z}, year={1998}, month=feb, pages={133–137} }

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