DOI: 10.1016/s0041-624x(99)00207-3. Quantitative determination of contact stiffness using atomic force acoustic microscopy

Quantitative determination of contact stiffness using atomic force acoustic microscopy

10.1016/s0041-624x(99)00207-3

Crossref journal-article

Elsevier BV

Ultrasonics (78)

Bibliography

Rabe, U., Amelio, S., Kester, E., Scherer, V., Hirsekorn, S., & Arnold, W. (2000). Quantitative determination of contact stiffness using atomic force acoustic microscopy. Ultrasonics, 38(1â8), 430â437.

Authors 6

U. Rabe (first)
S. Amelio (additional)
E. Kester (additional)
V. Scherer (additional)
S. Hirsekorn (additional)
W. Arnold (additional)

References 25 Referenced 255

10.1103/PhysRevLett.56.930 / Phys. Rev. Lett. by Binnig (1986)
10.1088/0957-4484/2/2/004 / Nanotechnology by Maivald (1991)
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10.1002/(SICI)1096-9918(199905/06)27:5/6<336::AID-SIA512>3.0.CO;2-0 / Surf. Interface Anal. by Krotil (1999)
{'key': '10.1016/S0041-624X(99)00207-3_REF5', 'first-page': '669', 'volume': 'Vol. 22', 'author': 'Rabe', 'year': '1996'} by Rabe (1996)
10.1063/1.111524 / Appl. Phys. Lett. by Yamanaka (1994)
{'key': '10.1016/S0041-624X(99)00207-3_REF7', 'first-page': '701', 'volume': 'Vol. 22', 'author': 'Vairac', 'year': '1996'} by Vairac (1996)
10.1109/ULTSYM.1994.401610 / IEEE Ultrason. Symp. Proc. by Chilla (1994)
10.1063/1.1147409 / Rev. Sci. Instrum. by Rabe (1996)
10.1063/1.120547 / Appl. Phys. Lett. by Wright (1997)
10.1007/s003390051153 / Appl. Phys. A by Yamanaka (1998)
10.1088/0957-4484/8/2/003 / Nanotechnology by Hirsekorn (1997)
10.1063/1.365935 / J. Appl. Phys. by Turner (1997)
10.1007/s003390051145 / Appl. Phys. A by Rabe (1998)
10.1002/(SICI)1096-9918(199905/06)27:5/6<386::AID-SIA526>3.0.CO;2-J / Surf. Interface Anal. by Rabe (1999)
10.1023/A:1019123525610 / Tribol. Lett. by Mazeran (1995)
{'key': '10.1016/S0041-624X(99)00207-3_REF17', 'series-title': 'Contact Mechanics', 'author': 'Johnson', 'year': '1995'} / Contact Mechanics by Johnson (1995)
10.1002/(SICI)1096-9918(199905/06)27:5/6<600::AID-SIA508>3.0.CO;2-W / Surf. Interface Anal. by Yamanaka (1999)
10.1016/S0304-8853(98)00420-X / J. Magn. Magn. Mater. by Tailhades (1999)
{'key': '10.1016/S0041-624X(99)00207-3_REF20', 'author': 'Kester', 'year': '2000', 'journal-title': 'J. Phys. Chem. Solids'} / J. Phys. Chem. Solids by Kester (2000)
10.1063/1.341924 / J. Appl. Phys. by Langlet (1988)
10.1557/S0883769400031444 / MRS Bull. by Auciello (1998)
{'key': '10.1016/S0041-624X(99)00207-3_REF23', 'series-title': 'Proc. 24th Int. Symp. on Acoustical Imaging', 'author': 'Rabe', 'year': '1998'} / Proc. 24th Int. Symp. on Acoustical Imaging by Rabe (1998)
10.1063/1.123266 / Appl. Phys. Lett. by Eng (1999)
{'key': '10.1016/S0041-624X(99)00207-3_REF25', 'series-title': 'Electroceramics', 'author': 'Moulson', 'year': '1990'} / Electroceramics by Moulson (1990)

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 6:14 p.m.)
Deposited	6 years, 4 months ago (April 14, 2019, 1:58 p.m.)
Indexed	4 weeks, 1 day ago (Aug. 6, 2025, 9:28 a.m.)
Issued	25 years, 6 months ago (March 1, 2000)
Published	25 years, 6 months ago (March 1, 2000)
Published Print	25 years, 6 months ago (March 1, 2000)

Funders 0

None

BibTeX

@article{Rabe_2000, title={Quantitative determination of contact stiffness using atomic force acoustic microscopy}, volume={38}, ISSN={0041-624X}, url={http://dx.doi.org/10.1016/s0041-624x(99)00207-3}, DOI={10.1016/s0041-624x(99)00207-3}, number={1–8}, journal={Ultrasonics}, publisher={Elsevier BV}, author={Rabe, U. and Amelio, S. and Kester, E. and Scherer, V. and Hirsekorn, S. and Arnold, W.}, year={2000}, month=mar, pages={430–437} }

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