DOI: 10.1016/s0040-6090(97)00972-3. Ellipsometric study of Fano resonance in heavily doped p-type Si and SiGe alloys

Ellipsometric study of Fano resonance in heavily doped p-type Si and SiGe alloys

10.1016/s0040-6090(97)00972-3

Crossref journal-article

Elsevier BV

Thin Solid Films (78)

Bibliography

HumlÄ±ÌÄek, J. (1998). Ellipsometric study of Fano resonance in heavily doped p-type Si and SiGe alloys. Thin Solid Films, 313â314, 656â660.

Authors 1

J. Humlı́ček (first)

References 9 Referenced 6

10.1103/PhysRev.124.1866 / Phys. Rev. by Fano (1961)
10.1103/PhysRevB.16.4524 / Phys. Rev. B by Watkins (1977)
10.1103/PhysRevB.52.5672 / Phys. Rev. B by Simonian (1995)
10.1103/PhysRevB.8.4734 / Phys. Rev. B by Cerdeira (1973)
10.1016/S0038-1098(96)00548-0 / Solid State Commun. by Belitsky (1996)
10.1080/00150199608223612 / Ferroelectrics by Humlı́ček (1996)
10.1016/S0040-6090(97)00978-4 / Thin Solid Films by Humlı́ček (1998)
J.S. Blakemore, Semiconductor Statistics, Dover Publications, New York, 1987.
10.1103/PhysRevB.39.10056 / Phys. Rev. B by Alonso (1989)

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 9:06 p.m.)
Deposited	3 years, 2 months ago (June 16, 2022, 1:26 a.m.)
Indexed	6 months, 1 week ago (Feb. 21, 2025, 12:08 a.m.)
Issued	27 years, 6 months ago (Feb. 1, 1998)
Published	27 years, 6 months ago (Feb. 1, 1998)
Published Print	27 years, 6 months ago (Feb. 1, 1998)

Funders 1

Ministerstvo Školství, Mládeže a Tělovýchovy 10.13039/501100001823
Region: Europe
gov (National government)
Labels4
1. The Ministry of Education, Youth and Sports
2. MŠMT
3. MŠMT
4. MEYS

BibTeX

@article{Huml_ek_1998, title={Ellipsometric study of Fano resonance in heavily doped p-type Si and SiGe alloys}, volume={313–314}, ISSN={0040-6090}, url={http://dx.doi.org/10.1016/s0040-6090(97)00972-3}, DOI={10.1016/s0040-6090(97)00972-3}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Humlı́ček, J.}, year={1998}, month=feb, pages={656–660} }

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