DOI: 10.1016/s0040-6090(96)09508-9. Dopant influence on dielectric losses, leakage behaviour, and resistance degradation of SrTiO3 thin films

Dopant influence on dielectric losses, leakage behaviour, and resistance degradation of SrTiO3 thin films

10.1016/s0040-6090(96)09508-9

Crossref journal-article

Elsevier BV

Thin Solid Films (78)

Bibliography

Hofman, W., Hoffmann, S., & Waser, R. (1997). Dopant influence on dielectric losses, leakage behaviour, and resistance degradation of SrTiO3 thin films. Thin Solid Films, 305(1â2), 66â73.

Authors 3

W. Hofman (first)
S. Hoffmann (additional)
R. Waser (additional)

References 36 Referenced 82

10.1111/j.1151-2916.1994.tb06983.x / J. Am. Ceram. Soc. by Vollmann (1994)
{'key': '10.1016/S0040-6090(96)09508-9_bib2', 'series-title': 'Ferroelectric Ceramics', 'first-page': '273', 'author': 'Waser', 'year': '1993'} / Ferroelectric Ceramics by Waser (1993)
{'year': '1994', 'series-title': '6th Int. Symp. on Integrated Ferroelectrics', 'author': 'Melnick', 'key': '10.1016/S0040-6090(96)09508-9_bib3'} / 6th Int. Symp. on Integrated Ferroelectrics by Melnick (1994)
10.1080/10584589508012269 / Integrated Ferroelectrics by Sedlar (1995)
C.-J. Peng and S.B. Krupanidhi, J. Appl. Phys., submitted.
{'year': '1996', 'series-title': '1996 Spring Meeting of the Materials Research Society', 'author': 'Gilbert', 'key': '10.1016/S0040-6090(96)09508-9_bib6'} / 1996 Spring Meeting of the Materials Research Society by Gilbert (1996)
10.1109/58.19168 / IEEE Trans. Ultrason. Ferroelec. Freq. Contr. by Xu (1989)
{'year': '1991', 'series-title': 'Proc. 2nd European Ceramic Society Conference', 'author': 'Guldner', 'key': '10.1016/S0040-6090(96)09508-9_bib8'} / Proc. 2nd European Ceramic Society Conference by Guldner (1991)
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G.W. Dietz and R. Waser, Thin Solid Films, to be published.
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{'year': '1996', 'series-title': 'Proc. 8th Int. Symp. on Integrated Ferroelectrics', 'author': 'Waser', 'key': '10.1016/S0040-6090(96)09508-9_bib19'} / Proc. 8th Int. Symp. on Integrated Ferroelectrics by Waser (1996)
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Dates

Type	When
Created	23 years ago (July 25, 2002, 5:06 p.m.)
Deposited	6 years, 4 months ago (April 15, 2019, 8:23 p.m.)
Indexed	2 months, 1 week ago (June 16, 2025, 9:29 a.m.)
Issued	28 years ago (Aug. 1, 1997)
Published	28 years ago (Aug. 1, 1997)
Published Print	28 years ago (Aug. 1, 1997)

Funders 0

None

BibTeX

@article{Hofman_1997, title={Dopant influence on dielectric losses, leakage behaviour, and resistance degradation of SrTiO3 thin films}, volume={305}, ISSN={0040-6090}, url={http://dx.doi.org/10.1016/s0040-6090(96)09508-9}, DOI={10.1016/s0040-6090(96)09508-9}, number={1–2}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Hofman, W. and Hoffmann, S. and Waser, R.}, year={1997}, month=aug, pages={66–73} }

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