DOI: 10.1016/s0040-6090(02)00990-2. Determination of kinetic parameters in layer-by-layer growth from RHEED profile analysis

Determination of kinetic parameters in layer-by-layer growth from RHEED profile analysis

10.1016/s0040-6090(02)00990-2

Crossref journal-article

Elsevier BV

Thin Solid Films (78)

Bibliography

Dulot, F., Kierren, B., & Malterre, D. (2003). Determination of kinetic parameters in layer-by-layer growth from RHEED profile analysis. Thin Solid Films, 423(1), 64â69.

Authors 3

F. Dulot (first)
B. Kierren (additional)
D. Malterre (additional)

References 17 Referenced 10

{'key': '10.1016/S0040-6090(02)00990-2_BIB1', 'first-page': '1', 'volume': 'A31', 'author': 'Neave', 'year': '1983', 'journal-title': 'Surf. Appl. Sci.'} / Surf. Appl. Sci. by Neave (1983)
10.1063/1.327877 / J. Appl. Phys. by Hahn (1980)
10.1016/0039-6028(95)00087-9 / Surf. Sci. by Dürr (1995)
10.1103/PhysRevB.57.12544 / Phys. Rev. B by Bardotti (1998)
10.1103/PhysRevB.46.1929 / Phys. Rev. B by Ernst (1992)
{'key': '10.1016/S0040-6090(02)00990-2_BIB6', 'series-title': 'Applied RHEED, Reflection High-Energy Electron Diffraction Crystal Growth', 'author': 'Braun', 'year': '1999'} / Applied RHEED, Reflection High-Energy Electron Diffraction Crystal Growth by Braun (1999)
10.1103/PhysRevLett.70.3615 / Phys. Rev. Lett. by Stroscio (1993)
{'key': '10.1016/S0040-6090(02)00990-2_BIB8', 'first-page': '4937', 'volume': '80', 'author': 'Braun', 'year': '1998', 'journal-title': 'Phys. Rev. Lett.'} / Phys. Rev. Lett. by Braun (1998)
10.1098/rspa.1991.0013 / Proc. R. Soc. Lond. A by Peng (1991)
10.1103/PhysRevB.49.8522 / Phys. Rev. B by Stroscio (1994)
10.1016/0040-6090(95)06947-X / Thin Solid Films by Amar (1996)
10.1103/PhysRevLett.72.3064 / Phys. Rev. Lett. by Zuo (1994)
10.1016/S0167-5729(99)80001-6 / Surf. Sci. Rep. by Brune (1998)
10.1088/0034-4885/47/4/002 / Rep. Prog. Phys. by Venables (1984)
10.1103/PhysRevLett.75.4476 / Phys. Rev. Lett. by Fassbender (1995)
10.1016/S0039-6028(99)01126-7 / Surf. Sci. by Turban (2000)
10.1016/S0039-6028(96)01559-2 / Surf. Sci. by May (1997)

Dates

Type	When
Created	22 years, 8 months ago (Dec. 27, 2002, 4:29 p.m.)
Deposited	6 years, 5 months ago (March 31, 2019, 6:50 a.m.)
Indexed	1 year, 2 months ago (June 29, 2024, 2:29 a.m.)
Issued	22 years, 8 months ago (Jan. 1, 2003)
Published	22 years, 8 months ago (Jan. 1, 2003)
Published Print	22 years, 8 months ago (Jan. 1, 2003)

Funders 0

None

BibTeX

@article{Dulot_2003, title={Determination of kinetic parameters in layer-by-layer growth from RHEED profile analysis}, volume={423}, ISSN={0040-6090}, url={http://dx.doi.org/10.1016/s0040-6090(02)00990-2}, DOI={10.1016/s0040-6090(02)00990-2}, number={1}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Dulot, F. and Kierren, B. and Malterre, D.}, year={2003}, month=jan, pages={64–69} }

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