Crossref
journal-article
Elsevier BV
Surface Science (78)
References
38
Referenced
28
10.1116/1.571567
/ J. Vac. Sci. Technol. by Kaminsky (1982)10.1016/S0257-8972(07)80091-0
/ Surf. Coat. Technol. by Kawata (1992)10.1016/0301-679X(90)90045-Q
/ Tribol. Int. by Boving (1990)10.1016/0039-6028(91)91196-5
/ Surf. Sci. by Souda (1991)10.1116/1.576308
/ J. Vac. Sci. Technol. A by Miura (1989)10.1016/S0039-6028(87)81132-9
/ Surf. Sci. by Lindberg (1987)10.1116/1.578133
/ J. Vac. Sci. Technol. A by Gellman (1992)10.1021/la00001a046
/ Langmuir by McFadden (1995)10.1007/BF00209774
/ Tribol. Lett. by McFadden (1995)10.1116/1.576704
/ J. Vac. Sci. Technol. A by DeKoven (1990)10.1016/0040-6090(94)90318-2
/ Thin Solid Films by Mak (1994){'key': '10.1016/S0039-6028(98)00748-1_BIB12', 'first-page': '263', 'volume': '17', 'author': 'Krim', 'year': '1995', 'journal-title': 'Comments Condens. Mater. Phys.'}
/ Comments Condens. Mater. Phys. by Krim (1995)10.1103/PhysRevLett.76.803
/ Phys. Rev. Lett. by Daly (1996)10.1103/PhysRevLett.66.181
/ Phys. Rev. Lett. by Krim (1991)10.1103/PhysRevLett.80.1690
/ Phys. Rev. Lett. by Dayo (1998)10.1126/science.265.5176.1209
/ Science by Cieplak (1994)10.1103/PhysRevB.54.8252
/ Phys. Rev. B by Smith (1996)10.1103/PhysRevB.42.760
/ Phys. Rev. B by Sokoloff (1990)10.1063/1.470125
/ J. Chem. Phys. by Persson (1995)10.1103/PhysRevB.44.3277
/ Phys. Rev. B by Persson (1991)10.1103/PhysRevB.56.4938
/ Phys. Rev. B by Tomassone (1997)10.1016/S0039-6028(97)00185-4
/ Surf. Sci. by Perry (1997)10.1016/S0039-6028(98)00456-7
/ Surf. Sci. by Frantz (1998)10.1023/A:1019167524643
/ Tribol. Lett. by Frantz (1998)- S.R. Hatch, PhD dissertation, University of Texas, 1990.
{'key': '10.1016/S0039-6028(98)00748-1_BIB26', 'first-page': '1', 'volume': '5', 'author': 'Yates', 'year': '1987', 'journal-title': 'J. Vac. Sci. Technol. A'}
/ J. Vac. Sci. Technol. A by Yates (1987)- Initial calibrations of the dosing system utilized D2O adsorption on an inert amorphous carbon (a:C-Hx) surface.
10.1063/1.1147411
/ Rev. Sci. Instrum. by Ogletree (1996)10.1103/PhysRevB.48.5675
/ Phys. Rev. B by Sheiko (1993)-
Several papers have reviewed the details of tribological measurements using AFM. See, for example, R.W. Carpick, M. Salmeron, Chem. Rev. 97 (1997) 1163.
(
10.1021/cr960068q
) {'key': '10.1016/S0039-6028(98)00748-1_BIB31', 'first-page': '1887', 'volume': '81', 'author': 'van den Oetelaar', 'year': '1998', 'journal-title': 'Phys. Rev. Lett.'}
/ Phys. Rev. Lett. by van den Oetelaar (1998)-
I.L. Singer, H.M. Pollock (Eds.), Fundamentals of Friction: Macroscopic and Microscopic Processes, Kluwer, Dordrecht, 1992, p. 621.
(
10.1007/978-94-011-2811-7
) 10.1021/la950898j
/ Langmuir by Krim (1996)10.1209/0295-5075/8/6/002
/ Europhys. Lett. by Levitov (1989)10.1021/jp962561b
/ J. Phys. Chem. B by Perry (1997)10.1016/0040-6090(94)06511-X
/ Thin Solid Films by Harrison (1995)10.1063/1.460297
/ J. Chem. Phys. by Jackson (1991)10.1103/PhysRevLett.80.121
/ Phys. Rev. Lett. by Witte (1998)
Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 25, 2002, 8:59 p.m.) |
Deposited | 5 years, 6 months ago (Feb. 4, 2020, 3:13 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 7, 2024, 6:24 a.m.) |
Issued | 26 years, 9 months ago (Nov. 1, 1998) |
Published | 26 years, 9 months ago (Nov. 1, 1998) |
Published Print | 26 years, 9 months ago (Nov. 1, 1998) |
@article{Merrill_1998, title={Fundamental measurements of the friction of clean and oxygen-covered VC(100) with ultrahigh vacuum atomic force microscopy: evidence for electronic contributions to interfacial friction}, volume={418}, ISSN={0039-6028}, url={http://dx.doi.org/10.1016/s0039-6028(98)00748-1}, DOI={10.1016/s0039-6028(98)00748-1}, number={1}, journal={Surface Science}, publisher={Elsevier BV}, author={Merrill, Philip B and Perry, Scott S}, year={1998}, month=nov, pages={342–351} }