DOI: 10.1016/s0039-6028(97)00054-x. Measurement of oxide film growth on Mg and Al surfaces over extended periods using XPS

Measurement of oxide film growth on Mg and Al surfaces over extended periods using XPS

10.1016/s0039-6028(97)00054-x

Crossref journal-article

Elsevier BV

Surface Science (78)

Bibliography

Chen, C., Splinter, S. J., Do, T., & McIntyre, N. S. (1997). Measurement of oxide film growth on Mg and Al surfaces over extended periods using XPS. Surface Science, 382(1â3), L652âL657.

Authors 4

C. Chen (first)
S.J. Splinter (additional)
T. Do (additional)
N.S. McIntyre (additional)

References 20 Referenced 126

{'key': '10.1016/S0039-6028(97)00054-X_BIB1', 'first-page': '485', 'volume': 'Vol. 1', 'author': 'McIntyre', 'year': '1990'} by McIntyre (1990)
10.1002/sia.740150109 / Surf. Interface Anal. by Strohmeier (1990)
10.1016/0039-6028(93)90396-2 / Surf. Sci. by Splinter (1993)
10.1016/0039-6028(94)90003-5 / Surf. Sci. by Splinter (1994)
10.1016/0039-6028(94)90266-6 / Surf. Sci. by Splinter (1994)
T. Do, PhD thesis, The University of Western Ontario.
10.1088/0034-4885/12/1/308 / Rep. Prog. Phys. by Cabrera (1948)
T. Do. S.J. Splinter, C. Chen, N.S. McIntyre, to be published.
{'key': '10.1016/S0039-6028(97)00054-X_BIB9', 'series-title': 'Corrosion', 'author': 'Shreir', 'year': '1994'} / Corrosion by Shreir (1994)
10.1016/0010-938X(83)90058-6 / Corros. Sci. by Textor (1983)
10.1002/sia.740201108 / Surf. Interface Anal. by Marcus (1993)
10.1016/0378-5963(81)90094-5 / Appl. Surf. Sci. by Ghijsen (1981)
10.1016/0039-6028(81)90316-2 / Surf. Sci. by Allen (1981)
10.1016/0039-6028(77)90135-2 / Surf. Sci. by Fuggle (1977)
10.1002/sia.740210505 / Surf. Interface Anal. by Olefjord (1994)
10.1016/0368-2048(76)80015-1 / J. Electron Spectrosc. Relat. Phenom. by Scofield (1976)
10.1002/sia.740111107 / Surf. Interface Anal. by McIntyre (1988)
H. Dunlop, private communication.
10.1016/0039-6028(88)90014-3 / Surf. Sci. by Mullins (1988)
10.1149/1.2127496 / J. Electrochem. Soc. by Grimblot (1981)

Dates

Type	When
Created	23 years ago (July 25, 2002, 4:59 p.m.)
Deposited	6 years, 4 months ago (April 15, 2019, 11:50 p.m.)
Indexed	1 month, 2 weeks ago (July 8, 2025, 11:45 a.m.)
Issued	28 years, 2 months ago (June 1, 1997)
Published	28 years, 2 months ago (June 1, 1997)
Published Print	28 years, 2 months ago (June 1, 1997)

Funders 0

None

BibTeX

@article{Chen_1997, title={Measurement of oxide film growth on Mg and Al surfaces over extended periods using XPS}, volume={382}, ISSN={0039-6028}, url={http://dx.doi.org/10.1016/s0039-6028(97)00054-x}, DOI={10.1016/s0039-6028(97)00054-x}, number={1–3}, journal={Surface Science}, publisher={Elsevier BV}, author={Chen, C. and Splinter, S.J. and Do, T. and McIntyre, N.S.}, year={1997}, month=jun, pages={L652–L657} }

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