Crossref journal-article
Elsevier BV
Surface Science (78)
Bibliography

Faul, J. W. O., Volkmann, U. G., & Knorr, K. (1990). Ellipsometric thickness and coverage of physisorbed layers of Xe, Kr, Ar and N2 on graphite. Surface Science, 227(3), 390–394.

Authors 3
  1. J.W.O. Faul (first)
  2. U.G. Volkmann (additional)
  3. K. Knorr (additional)
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Dates
Type When
Created 19 years, 11 months ago (Sept. 9, 2005, 11:51 a.m.)
Deposited 6 years, 7 months ago (Jan. 22, 2019, 7 a.m.)
Indexed 1 year, 6 months ago (Feb. 4, 2024, 11:01 a.m.)
Issued 35 years, 5 months ago (March 1, 1990)
Published 35 years, 5 months ago (March 1, 1990)
Published Print 35 years, 5 months ago (March 1, 1990)
Funders 0

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@article{Faul_1990, title={Ellipsometric thickness and coverage of physisorbed layers of Xe, Kr, Ar and N2 on graphite}, volume={227}, ISSN={0039-6028}, url={http://dx.doi.org/10.1016/s0039-6028(05)80026-3}, DOI={10.1016/s0039-6028(05)80026-3}, number={3}, journal={Surface Science}, publisher={Elsevier BV}, author={Faul, J.W.O. and Volkmann, U.G. and Knorr, K.}, year={1990}, month=mar, pages={390–394} }