DOI: 10.1016/1044-5803(94)00047-o. Crystallographic characterization of planes in the scanning electron microscope

Crystallographic characterization of planes in the scanning electron microscope

10.1016/1044-5803(94)00047-o

Crossref journal-article

Elsevier BV

Materials Characterization (78)

Bibliography

Randle, V. (1995). Crystallographic characterization of planes in the scanning electron microscope. Materials Characterization, 34(1), 29â34.

Authors 1

Valerie Randle (first)

References 7 Referenced 33

{'key': '10.1016/1044-5803(94)00047-O_BIB1', 'series-title': 'Microtexture determination and its applications', 'author': 'Randle', 'year': '1992'} / Microtexture determination and its applications by Randle (1992)
10.1007/BF01165988 / J. Mat. Sci. / Review-microtexture determination by electron back-scatter diffraction by Dingley (1992)
10.1016/0036-9748(89)90129-4 / Scripta Met. / Measurement of boundary plane inclination in a scanning electron microscope by Randle (1989)
10.1179/mst.1991.7.11.985 / Mat. Sci. Tech. / Influence of kinetic factors on distribution of grain boundary planes in nickel by Randle (1991)
10.1016/0956-7151(92)90119-Y / Acta Met. Mat. / Crystallographic features of intergranular crack initiation in fatigued copper polycrystals by Liu (1992)
10.1155/TSM.14-18.97 / Tex. and Mic. / Local texture measurements by EBSP. New computer procedures by Jensen (1991)
{'key': '10.1016/1044-5803(94)00047-O_BIB7', 'series-title': 'Measurement of grain boundary geometry', 'author': 'Randle', 'year': '1993'} / Measurement of grain boundary geometry by Randle (1993)

Dates

Type	When
Created	23 years ago (July 25, 2002, 9:38 p.m.)
Deposited	6 years, 4 months ago (April 15, 2019, 10:23 a.m.)
Indexed	2 months, 3 weeks ago (May 27, 2025, 10:58 a.m.)
Issued	30 years, 7 months ago (Jan. 1, 1995)
Published	30 years, 7 months ago (Jan. 1, 1995)
Published Print	30 years, 7 months ago (Jan. 1, 1995)

Funders 0

None

BibTeX

@article{Randle_1995, title={Crystallographic characterization of planes in the scanning electron microscope}, volume={34}, ISSN={1044-5803}, url={http://dx.doi.org/10.1016/1044-5803(94)00047-o}, DOI={10.1016/1044-5803(94)00047-o}, number={1}, journal={Materials Characterization}, publisher={Elsevier BV}, author={Randle, Valerie}, year={1995}, month=jan, pages={29–34} }

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