Crossref
journal-article
Elsevier BV
Micron (78)
References
52
Referenced
260
{'year': '1940', 'series-title': 'Elektronen-Ubermikroskopie', 'author': 'von Ardenne', 'key': '10.1016/0968-4328(96)00023-6_bib1'}
/ Elektronen-Ubermikroskopie by von Ardenne (1940){'year': '1940', 'series-title': 'Elektronen-Ubermikroskopie', 'author': 'von Ardenne', 'key': '10.1016/0968-4328(96)00023-6_bib2'}
/ Elektronen-Ubermikroskopie by von Ardenne (1940){'year': '1985', 'author': 'Beadle', 'key': '10.1016/0968-4328(96)00023-6_bib3'}
by Beadle (1985){'key': '10.1016/0968-4328(96)00023-6_bib4', 'first-page': '940', 'volume': '59', 'author': 'Bethe', 'year': '1941', 'journal-title': 'Phys. Rev.'}
/ Phys. Rev. by Bethe (1941)10.1016/0304-3991(94)90109-0
/ Ultramicroscopy by Bleloch (1994)10.1002/sca.4950130503
/ Scanning by Brochert (1991){'key': '10.1016/0968-4328(96)00023-6_bib7', 'series-title': 'Proc. 49th Ann. Mtg EMSA', 'first-page': '534', 'author': 'Bradley', 'year': '1991'}
/ Proc. 49th Ann. Mtg EMSA by Bradley (1991)10.1116/1.587456
/ J. Vac. Sci. Technol. by Brodie (1994)10.1016/S0031-8914(38)80103-8
/ Physica, (Amsterdam) by Bruining (1938){'key': '10.1016/0968-4328(96)00023-6_bib10_1', 'series-title': 'Proc. 6th Int. Cong. on EM', 'first-page': '1', 'author': 'Butler', 'year': '1966'}
/ Proc. 6th Int. Cong. on EM by Butler (1966){'key': '10.1016/0968-4328(96)00023-6_bib10_2', 'series-title': 'Proc. 6th Int. Cong. on EM', 'first-page': '191', 'author': 'Butler', 'year': '1966'}
/ Proc. 6th Int. Cong. on EM by Butler (1966){'key': '10.1016/0968-4328(96)00023-6_bib11', 'series-title': 'Microscopy—The Key Research Tool', 'first-page': '103', 'author': 'Butler', 'year': '1992'}
/ Microscopy—The Key Research Tool by Butler (1992)10.1063/1.336493
/ J. appl. Phys. by Cazaux (1986)10.1063/1.1663306
/ J. appl. Phys. by Chung (1974)10.1063/1.1683435
/ Rev. sci. Instr. by Crewe (1968){'key': '10.1016/0968-4328(96)00023-6_bib15', 'first-page': '331', 'volume': '29', 'author': 'Drescher', 'year': '1970', 'journal-title': 'Z. angew. Phys.'}
/ Z. angew. Phys. by Drescher (1970)10.1016/0039-6028(85)90501-1
/ Surface Sci. by Dwyer (1985)10.1147/rd.305.0460
/ IBM J. Res. Develop. by Fink (1986)10.1007/BF01694486
/ Czech. J. Phys. by Frank (1994)10.1002/xrs.1300130308
/ X-ray Spectrometry by Graham (1984){'key': '10.1016/0968-4328(96)00023-6_bib20', 'first-page': '21', 'article-title': 'Scanning Electron Microscopy and X-ray Microanalysis', 'author': 'Goldstein', 'year': '1992'}
/ Scanning Electron Microscopy and X-ray Microanalysis by Goldstein (1992)10.1002/sca.4950160204
/ Scanning by Harker (1994){'key': '10.1016/0968-4328(96)00023-6_bib22', 'first-page': '20', 'volume': '1', 'author': 'Jia', 'year': '1992', 'journal-title': 'Acta Microscopica'}
/ Acta Microscopica by Jia (1992){'key': '10.1016/0968-4328(96)00023-6_bib23', 'series-title': 'Microbeam Analysis—1987', 'first-page': '117', 'author': 'Joy', 'year': '1987'}
/ Microbeam Analysis—1987 by Joy (1987)10.1016/0304-3991(91)90020-7
/ Ultramicroscopy by Joy (1991){'year': '1995', 'series-title': 'Monte Carlo Modeling for Electron Microscopy and Microanalysis', 'author': 'Joy', 'key': '10.1016/0968-4328(96)00023-6_bib25'}
/ Monte Carlo Modeling for Electron Microscopy and Microanalysis by Joy (1995)10.1002/sca.4950170501
/ Scanning by Joy (1995){'key': '10.1016/0968-4328(96)00023-6_bib27', 'first-page': '109', 'volume': '1', 'author': 'Joy', 'year': '1995', 'journal-title': 'J. Micros. Soc. Am.'}
/ J. Micros. Soc. Am. by Joy (1995){'key': '10.1016/0968-4328(96)00023-6_bib28', 'first-page': '83', 'volume': '68', 'author': 'Kenway', 'year': '1984'}
by Kenway (1984){'key': '10.1016/0968-4328(96)00023-6_bib29', 'first-page': '467', 'volume': '16', 'author': 'Knoll', 'year': '1935', 'journal-title': 'Z. tech. Phys.'}
/ Z. tech. Phys. by Knoll (1935){'key': '10.1016/0968-4328(96)00023-6_bib30', 'series-title': 'Proc. 9th Ann. Symp. on Electron, Ion, and Laser Beams', 'first-page': '198', 'author': 'Kimura', 'year': '1967'}
/ Proc. 9th Ann. Symp. on Electron, Ion, and Laser Beams by Kimura (1967){'key': '10.1016/0968-4328(96)00023-6_bib31', 'first-page': '467', 'volume': '11', 'author': 'Knoll', 'year': '1935', 'journal-title': 'Z. Tech. Physik.'}
/ Z. Tech. Physik. by Knoll (1935){'year': '1994', 'author': 'Luo', 'key': '10.1016/0968-4328(96)00023-6_bib32'}
by Luo (1994)10.1080/10420159108220619
/ Rad. Effects and Defects in Solids by Luo (1991){'key': '10.1016/0968-4328(96)00023-6_bib34', 'first-page': '232', 'volume': '22', 'author': 'Matthes', 'year': '1942', 'journal-title': 'Z. tech. Phys.'}
/ Z. tech. Phys. by Matthes (1942){'key': '10.1016/0968-4328(96)00023-6_bib35', 'first-page': '16', 'volume': '18', 'author': 'Mulvey', 'year': '1973'}
by Mulvey (1973){'key': '10.1016/0968-4328(96)00023-6_bib36', 'first-page': '901', 'volume': '1', 'author': 'Nagatani', 'year': '1987', 'journal-title': 'Scanning Microsc.'}
/ Scanning Microsc. by Nagatani (1987)10.1007/BF00553278
/ J. Mat. Sci. by Ness (1986){'key': '10.1016/0968-4328(96)00023-6_bib38', 'first-page': '948', 'volume': '16', 'author': 'Ohlendorf', 'year': '1991', 'journal-title': 'Surf. Interface Anal.'}
/ Surf. Interface Anal. by Ohlendorf (1991)10.1016/0304-3991(94)00183-N
/ Ultramicroscopy / Field-emission SEM imaging of compositional and doping layer semiconductor superlattices by Perovic (1995){'key': '10.1016/0968-4328(96)00023-6_bib40', 'first-page': '143', 'volume': '1', 'author': 'Peters', 'year': '1980', 'journal-title': 'Scanning Electron Microscopy'}
/ Scanning Electron Microscopy by Peters (1980){'year': '1993', 'series-title': 'Low voltage scanning microscopy', 'author': 'Reimer', 'key': '10.1016/0968-4328(96)00023-6_bib41'}
/ Low voltage scanning microscopy by Reimer (1993){'key': '10.1016/0968-4328(96)00023-6_bib42', 'first-page': '18', 'volume': '26', 'author': 'Sato', 'year': '1994', 'journal-title': 'Hitachi Instrument News'}
/ Hitachi Instrument News by Sato (1994)10.1116/1.585700
/ J. Vac. Sci. Tech. by Sato (1991){'key': '10.1016/0968-4328(96)00023-6_bib44', 'series-title': 'Proc. 51st Ann. Mtg. MSA', 'first-page': '632', 'author': 'Scheinfein', 'year': '1993'}
/ Proc. 51st Ann. Mtg. MSA by Scheinfein (1993)10.1063/1.332840
/ J. appl. Phys. by Seiler (1984)10.1016/0304-3991(89)90214-3
/ Ultramicroscopy by Shao (1989)10.1016/0304-3991(94)90076-0
/ Ultramicroscopy by Spence (1994){'key': '10.1016/0968-4328(96)00023-6_bib48', 'first-page': '9', 'volume': '35', 'author': 'Sugiyama', 'year': '1986', 'journal-title': 'J. Electr. Micros.'}
/ J. Electr. Micros. by Sugiyama (1986){'key': '10.1016/0968-4328(96)00023-6_bib49', 'series-title': 'Proc. European Regional Conference on Electron Microscopy', 'first-page': '173', 'author': 'Thornton', 'year': '1960'}
/ Proc. European Regional Conference on Electron Microscopy by Thornton (1960){'key': '10.1016/0968-4328(96)00023-6_bib50', 'series-title': 'Proc. 52nd Annual Meeting MSA', 'first-page': '1024', 'author': 'Venables', 'year': '1994'}
/ Proc. 52nd Annual Meeting MSA by Venables (1994){'key': '10.1016/0968-4328(96)00023-6_bib51', 'first-page': '15', 'volume': '117', 'author': 'Zworykin', 'year': '1942', 'journal-title': 'ASTM Bull.'}
/ ASTM Bull. by Zworykin (1942)
Dates
Type | When |
---|---|
Created | 22 years, 3 months ago (April 30, 2003, 3:34 p.m.) |
Deposited | 6 years, 3 months ago (April 26, 2019, 5:58 p.m.) |
Indexed | 21 hours, 34 minutes ago (Aug. 20, 2025, 9:18 a.m.) |
Issued | 29 years, 2 months ago (June 1, 1996) |
Published | 29 years, 2 months ago (June 1, 1996) |
Published Print | 29 years, 2 months ago (June 1, 1996) |
@article{Joy_1996, title={Low voltage scanning electron microscopy}, volume={27}, ISSN={0968-4328}, url={http://dx.doi.org/10.1016/0968-4328(96)00023-6}, DOI={10.1016/0968-4328(96)00023-6}, number={3–4}, journal={Micron}, publisher={Elsevier BV}, author={Joy, David C. and Joy, Carolyn S.}, year={1996}, month=jun, pages={247–263} }