DOI: 10.1016/0968-4328(95)00020-8. Elastic strain determination in semiconductor epitaxial layers by HREM

Elastic strain determination in semiconductor epitaxial layers by HREM

10.1016/0968-4328(95)00020-8

Crossref journal-article

Elsevier BV

Micron (78)

Bibliography

Robertson, M. D., Corbett, J. M., Webb, J. B., Jagger, J., & Currie, J. E. (1995). Elastic strain determination in semiconductor epitaxial layers by HREM. Micron, 26(6), 521â537.

Authors 5

M.D. Robertson (first)
J.M. Corbett (additional)
J.B. Webb (additional)
J. Jagger (additional)
J.E. Currie (additional)

References 29 Referenced 12

10.1111/j.2517-6161.1959.tb00336.x / J. R. statis. Soc. / Control charts and stochastic processes by Barnard (1959)
10.1016/0304-3991(93)90234-O / Ultramicroscopy / Direct measurement of local lattice distortions in strained layer structures by HREM by Bierwolf (1993)
{'key': '10.1016/0968-4328(95)00020-8_BIB3', 'first-page': '419', 'article-title': 'Experimental deformation mechanics of materials from their near-atomic-resolution defect images', 'volume': '239', 'author': 'Choi', 'year': '1992'} / Experimental deformation mechanics of materials from their near-atomic-resolution defect images by Choi (1992)
{'year': '1978', 'author': 'Cullity', 'series-title': 'Elements of X-ray Diffraction', 'key': '10.1016/0968-4328(95)00020-8_BIB4'} / Elements of X-ray Diffraction by Cullity (1978)
10.1063/1.355881 / J. Appl. Phys. / The Fourier series method for the calculation of strain relaxation in strained-layer structures by Faux (1994)
Faux, D. A., 1994b. Private Correspondence.
10.1088/0953-8984/2/51/005 / J. Phys. Condens. Matter / Calculation of strain distributions at the edge of strained-layer structures by Faux (1990)
10.1139/p91-064 / Can. J. Phys. / Raman and infrared spectroscopy of In1−xGaxSb films grown on GaAs by metal-organic magnetron sputtering by Feng (1990)
10.1016/0304-3991(84)90219-5 / Ultramicroscopy / The effect of elastic relaxation on the local structure of lattice-modulated thin films by Gibson (1984)
10.1063/1.95516 / Appl. Phys. Lett. / Elastic relaxation in transmission electron microscopy of strained-layer superlattices by Gibson (1985)
10.1080/00401706.1961.10489923 / Technometrics / Average run lengths in cumulative sum chart quality control schemes by Goldsmith (1961)
{'key': '10.1016/0968-4328(95)00020-8_BIB12', 'first-page': '731', 'article-title': 'Theory of Dislocations', 'author': 'Hirth', 'year': '1992'} / Theory of Dislocations by Hirth (1992)
10.1088/0034-4885/42/11/002 / Rep. Prog. Phys. / The scattering of fast electrons by crystals by Humphreys (1979)
{'key': '10.1016/0968-4328(95)00020-8_BIB14', 'first-page': '129', 'article-title': 'Analysis of individual image periodicities across strained multilayers', 'volume': '2A', 'author': 'Hytch', 'year': '1994'} / Analysis of individual image periodicities across strained multilayers by Hytch (1994)
10.1063/1.356641 / J. Appl. Phys. / Strain mapping of ultrathin expitaxial ZnTe and MnTe layers imbedded in CdTe by Jouneau (1994)
{'key': '10.1016/0968-4328(95)00020-8_BIB16', 'first-page': '399', 'article-title': 'Strain mapping study of ultrathin pseudomorphic layers by HREM', 'volume': '1', 'author': 'Jouneau', 'year': '1994'} / Strain mapping study of ultrathin pseudomorphic layers by HREM by Jouneau (1994)
10.1002/jemt.1070240210 / Microsc. Res. Tech. / Improved TEM samples of semiconductors prepared by a small-angle cleavage technique by McCaffrey (1993)
10.1080/00401706.1961.10489922 / Technometrics / Cumulative sum charts by Page (1961)
10.1080/01418619108206123 / Phil. Mag. A / On the electron diffraction contrast of coherently strained semiconductor layers by Perovic (1991)
10.1139/p92-137 / Can. J. Phys. / Transmission electron microscopy characterization of In1−xGaxSb on (001) GaAs heteroepitaxial system by Robertson (1992)
10.1016/0304-3991(94)00200-7 / Ultramicroscopy / Determination of elastic strains in epitaxial layers by HREM by Robertson (1995)
10.1063/1.346546 / J. appl. Phys. / Growth and characterization of In1−xGaxSb by metalorganic magnetron sputtering by Rousina (1990)
10.1116/1.583473 / J. Vac. Sci. Technol. B / The effects of elastic relaxation on transmission electron microscopy studies of thinned composition-modulated materials by Treacy (1986)
10.1080/01418618508237563 / Phil. Mag. A / On elastic relaxation and long wavelength microstructures in spinodally decomposed InxGa1−xAsyP1−y epitaxial structures by Treacy (1985)
{'key': '10.1016/0968-4328(95)00020-8_BIB25', 'series-title': 'Proc. 50th Annual Meeting of the Electron Microscopy Society of America', 'first-page': '144', 'article-title': 'Determination of the strain field from an HREM image of a Si Lomer dislocation', 'author': 'Tsai', 'year': '1992'} / Proc. 50th Annual Meeting of the Electron Microscopy Society of America / Determination of the strain field from an HREM image of a Si Lomer dislocation by Tsai (1992)
10.1063/1.95999 / Appl. Phys. Lett. / Deposition of indium antimonide films by metalorganic magnetron sputtering by Webb (1985)
10.1016/0022-0248(94)90978-4 / J. Cryst. Growth / Magnetron sputter epitaxy and characterization of InSb/In1−xAlxSb strained layer superlattices by Webb (1994)
{'year': '1991', 'author': 'Wetherill', 'series-title': 'Statistical Process Control Theory and Practice', 'key': '10.1016/0968-4328(95)00020-8_BIB28'} / Statistical Process Control Theory and Practice by Wetherill (1991)
10.1080/00401706.1993.10484992 / Technometrics / Performance of CUSUM control schemes for serially correlated observations by Yashchin (1993)

Dates

Type	When
Created	23 years ago (July 25, 2002, 7:57 p.m.)
Deposited	8 months, 2 weeks ago (Dec. 5, 2024, 8:23 p.m.)
Indexed	8 months, 2 weeks ago (Dec. 6, 2024, 12:25 a.m.)
Issued	30 years, 7 months ago (Jan. 1, 1995)
Published	30 years, 7 months ago (Jan. 1, 1995)
Published Print	30 years, 7 months ago (Jan. 1, 1995)

Funders 0

None

BibTeX

@article{Robertson_1995, title={Elastic strain determination in semiconductor epitaxial layers by HREM}, volume={26}, ISSN={0968-4328}, url={http://dx.doi.org/10.1016/0968-4328(95)00020-8}, DOI={10.1016/0968-4328(95)00020-8}, number={6}, journal={Micron}, publisher={Elsevier BV}, author={Robertson, M.D. and Corbett, J.M. and Webb, J.B. and Jagger, J. and Currie, J.E.}, year={1995}, pages={521–537} }

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