DOI: 10.1016/0968-4328(94)00039-s. Tests of two alternative methods for measuring specimen thickness in a transmission electron microscope

Tests of two alternative methods for measuring specimen thickness in a transmission electron microscope

10.1016/0968-4328(94)00039-s

Crossref journal-article

Elsevier BV

Micron (78)

Bibliography

Yang, Y.-Y., & Egerton, R. F. (1995). Tests of two alternative methods for measuring specimen thickness in a transmission electron microscope. Micron, 26(1), 1â5.

Authors 2

Y.-Y. Yang (first)
R.F. Egerton (additional)

References 7 Referenced 34

{'key': '10.1016/0968-4328(94)00039-S_BIB1', 'series-title': 'Proc. XIIth International Congress for Electron Microscopy', 'first-page': '74', 'article-title': 'Measurement of the inelastic mean free path by EELS analyses of submicron particles', 'author': 'Bonney', 'year': '1990'} / Proc. XIIth International Congress for Electron Microscopy / Measurement of the inelastic mean free path by EELS analyses of submicron particles by Bonney (1990)
10.1080/13642819008208637 / Phil. Mag. B / Measurement of inelastic electron scattering cross-sections by electron energy-loss spectroscopy by Crozier (1990)
{'key': '10.1016/0968-4328(94)00039-S_BIB3', 'series-title': 'Electron Energy-Loss Spectroscopy in the Electron Microscope', 'author': 'Egerton', 'year': '1986'} / Electron Energy-Loss Spectroscopy in the Electron Microscope by Egerton (1986)
10.1016/0304-3991(87)90148-3 / Ultramicroscopy / Measurement of local thickness by electron energy-loss spectroscopy by Egerton (1987)
10.1103/PhysRevA.23.95 / Phys. Rev. A / Oscillator-strength moments, stopping powers and total inelastic-scattering cross sections for all elements through strontium by Inokuti (1981)
10.1002/jemt.1060080206 / J. Electron Microsc. Tech. / EELS log-ratio technique for specimen-thickness measurement in the TEM by Malis (1988)
10.1051/jphys:01975003602019900 / Le Journal de Physique / Mise au point d'une nouvelle méthode d'analyse quantitative des spectres de pertes d'énergie d'électrons rapides difusés dans la direction du faiseau incident: application a l'études des métaux nobles by Wehenkel (1975)

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 2:49 p.m.)
Deposited	6 years, 1 month ago (July 10, 2019, 2:39 a.m.)
Indexed	1 year, 1 month ago (July 31, 2024, 4:27 a.m.)
Issued	30 years, 8 months ago (Jan. 1, 1995)
Published	30 years, 8 months ago (Jan. 1, 1995)
Published Print	30 years, 8 months ago (Jan. 1, 1995)

Funders 0

None

BibTeX

@article{Yang_1995, title={Tests of two alternative methods for measuring specimen thickness in a transmission electron microscope}, volume={26}, ISSN={0968-4328}, url={http://dx.doi.org/10.1016/0968-4328(94)00039-s}, DOI={10.1016/0968-4328(94)00039-s}, number={1}, journal={Micron}, publisher={Elsevier BV}, author={Yang, Y.-Y. and Egerton, R.F.}, year={1995}, pages={1–5} }

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