DOI: 10.1016/0921-5093(93)90504-8. Origin and development of residual stresses in the NiNiO system: in-situ studies at high temperature by X-ray diffraction

Origin and development of residual stresses in the NiNiO system: in-situ studies at high temperature by X-ray diffraction

10.1016/0921-5093(93)90504-8

Crossref journal-article

Elsevier BV

Materials Science and Engineering: A (78)

Authors 3

Chun Liu (first)
Anne-Marie Huntz (additional)
Jean-Lou Lebrun (additional)

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Dates

Type	When
Created	22 years, 2 months ago (June 20, 2003, 9:45 p.m.)
Deposited	6 years, 5 months ago (March 19, 2019, 8:52 a.m.)
Indexed	1 month, 3 weeks ago (July 7, 2025, 5:06 a.m.)
Issued	32 years, 7 months ago (Jan. 1, 1993)
Published	32 years, 7 months ago (Jan. 1, 1993)
Published Print	32 years, 7 months ago (Jan. 1, 1993)

Funders 0

None

BibTeX

@article{Liu_1993, title={Origin and development of residual stresses in the NiNiO system: in-situ studies at high temperature by X-ray diffraction}, volume={160}, ISSN={0921-5093}, url={http://dx.doi.org/10.1016/0921-5093(93)90504-8}, DOI={10.1016/0921-5093(93)90504-8}, number={1}, journal={Materials Science and Engineering: A}, publisher={Elsevier BV}, author={Liu, Chun and Huntz, Anne-Marie and Lebrun, Jean-Lou}, year={1993}, month=jan, pages={113–126} }

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