DOI: 10.1016/0368-2048(74)80029-0. Electron escape depth in silicon

10.1016/0368-2048(74)80029-0

Crossref journal-article

Elsevier BV

Journal of Electron Spectroscopy and Related Phenomena (78)

Bibliography

Klasson, M., Berndtsson, A., Hedman, J., Nilsson, R., Nyholm, R., & Nordling, C. (1974). Electron escape depth in silicon. Journal of Electron Spectroscopy and Related Phenomena, 3(6), 427â434.

Authors 6

M. Klasson (first)
A. Berndtsson (additional)
J. Hedman (additional)
R. Nilsson (additional)
R. Nyholm (additional)
C. Nordling (additional)

References 28 Referenced 147

10.1016/0038-1098(70)90724-6 / Solid State Commun. by Baer (1970)
10.1088/0031-8949/5/1-2/015 / Physica Scripta by Klasson (1972)
10.1103/PhysRevB.5.1016 / Phys. Rev. B by Steinhardt (1972)
10.1103/PhysRevB.1.2357 / Phys. Rev. B by Kanter (1970)
10.1063/1.1656571 / J. Appl. Phys. by Palmberg (1968)
10.1016/0368-2048(72)80029-X / J. Electron Spectrosc. by Carlson (1972)
10.1016/0009-2614(73)80195-2 / Chem. Phys. Lett. by Brundle (1973)
10.1103/PhysRevB.1.522 / Phys. Rev. B by Kanter (1970)
{'key': '10.1016/0368-2048(74)80029-0_BIB9', 'first-page': '489', 'volume': '37', 'author': 'Nordberg', 'year': '1968', 'journal-title': 'Ark. Fys.'} / Ark. Fys. by Nordberg (1968)
{'key': '10.1016/0368-2048(74)80029-0_BIB10', 'author': 'Bergmark', 'year': '1973', 'journal-title': 'UUIP-832'} / UUIP-832 by Bergmark (1973)
{'key': '10.1016/0368-2048(74)80029-0_BIB11', 'first-page': '272', 'author': 'Mott', 'year': '1971'} by Mott (1971)
10.1063/1.1721636 / J. Appl. Phys. by Blois (1954)
{'key': '10.1016/0368-2048(74)80029-0_BIB13', 'first-page': '553', 'volume': '10', 'author': 'Hink', 'year': '1958', 'journal-title': 'Z. Angew. Phys.'} / Z. Angew. Phys. by Hink (1958)
10.1515/zna-1970-1234 / Z. Naturforsch. by Ebel (1970)
10.1063/1.1714494 / J. Appl. Phys. by Wolter (1965)
10.1063/1.1735008 / J. Appl. Phys. by Wainfan (1959)
10.1007/BF01394181 / Z. Phys. by Dahl (1968)
10.1016/0368-2048(73)80022-2 / J. Electron Spectrosc. by Johansson (1973)
10.1002/pssb.2220600126 / Phys. Status Solidi (b) by Leonhardt (1973)
S. P. Kowalczyk, L. Ley, F. R. McFeely, R. A. Pollak and D. A. Shirley, Phys. Rev. B, in press.
10.3891/acta.chem.scand.20-2880 / Acta Chem. Scand. by Larsson (1966)
10.1051/jphyscol:1971421 / J. Phys. (Paris) by Henke (1971)
10.1016/0368-2048(72)85007-2 / J. Electron Spectrosc. by Hedman (1972)
10.1016/0009-2614(71)85126-6 / Chem. Phys. Lett. by Sharma (1971)
10.1016/0039-6028(72)90196-3 / Surface Sci. by Seah (1972)
10.1016/0039-6028(71)90113-0 / Surface Sci. by Jacobi (1971)
10.1016/0375-9601(73)90751-2 / Phys. Lett. by Todd (1973)
10.1063/1.1662407 / J. Appl. Phys. by Tarng (1973)

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 4:54 a.m.)
Deposited	4 years, 3 months ago (May 3, 2021, 6:35 p.m.)
Indexed	1 month, 4 weeks ago (June 25, 2025, 8:10 p.m.)
Issued	51 years, 7 months ago (Jan. 1, 1974)
Published	51 years, 7 months ago (Jan. 1, 1974)
Published Print	51 years, 7 months ago (Jan. 1, 1974)

Funders 0

None

BibTeX

@article{Klasson_1974, title={Electron escape depth in silicon}, volume={3}, ISSN={0368-2048}, url={http://dx.doi.org/10.1016/0368-2048(74)80029-0}, DOI={10.1016/0368-2048(74)80029-0}, number={6}, journal={Journal of Electron Spectroscopy and Related Phenomena}, publisher={Elsevier BV}, author={Klasson, M. and Berndtsson, A. and Hedman, J. and Nilsson, R. and Nyholm, R. and Nordling, C.}, year={1974}, month=jan, pages={427–434} }

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