DOI: 10.1016/0304-3991(94)90149-x. Quantitative analysis of the deformation and chemical profiles of strained multilayers

Quantitative analysis of the deformation and chemical profiles of strained multilayers

10.1016/0304-3991(94)90149-x

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Bayle, P., Deutsch, T., Gilles, B., LanÃ§on, F., Marty, A., & Thibault, J. (1994). Quantitative analysis of the deformation and chemical profiles of strained multilayers. Ultramicroscopy, 56(1â3), 94â107.

Authors 6

P. Bayle (first)
T. Deutsch (additional)
B. Gilles (additional)
F. Lançon (additional)
A. Marty (additional)
J. Thibault (additional)

References 17 Referenced 56

{'key': '10.1016/0304-3991(94)90149-X_BIB1', 'article-title': 'Mechanisms of Thin Film Evolution', 'author': 'Gilles', 'year': '1993', 'journal-title': 'Mater. Res. Soc. Symp. Proc.'} / Mater. Res. Soc. Symp. Proc. / Mechanisms of Thin Film Evolution by Gilles (1993)
{'key': '10.1016/0304-3991(94)90149-X_BIB2', 'series-title': 'Thesis', 'author': 'Eymery', 'year': '1992'} / Thesis by Eymery (1992)
10.1557/PROC-237-511 / Mater. Res. Soc. Symp. Proc. by Gilles (1992)
10.1016/0304-3991(93)90234-O / Ultramicroscopy by Beirwolf (1993)
10.1016/0304-3991(90)90018-H / Ultramicroscopy by Ourmazd (1990)
10.1103/PhysRevB.45.14065 / Phys. Rev. by Dandrea (1992)
10.1063/1.356641 / J. Appl. Phys. by Jouneau (1994)
10.1103/PhysRevB.38.5944 / Phys. Rev. B by Renaud (1988)
{'key': '10.1016/0304-3991(94)90149-X_BIB9', 'first-page': '237', 'volume': 'Vol. 1', 'author': 'Colliex', 'year': '1992', 'journal-title': 'Electron Microscopy EUREM 92'} / Electron Microscopy EUREM 92 by Colliex (1992)
M. Tence, M. Quartuccio and C. Colliex, Ultramicroscopy, submitted.
10.1016/0304-3991(87)90080-5 / Ultramicroscopy by Stadelmann (1987)
10.1107/S0567739470000050 / Acta Cryst. A by Radi (1970)
10.1080/14786437708238520 / Phil. Mag. by Bruce (1977)
10.1051/jp1:1993163 / J. Phys. I France by Eymery (1992)
{'key': '10.1016/0304-3991(94)90149-X_BIB15', 'series-title': 'Computer Simulation in Materials Science', 'first-page': '365', 'author': 'Lançon', 'year': '1991'} / Computer Simulation in Materials Science by Lançon (1991)
10.1103/PhysRevB.44.5970 / Phys. Rev. B by Luedtke (1991)
10.1103/PhysRevLett.71.754 / Phys. Rev. Lett. by Nielsen (1993)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 7:43 p.m.)
Deposited	6 years, 4 months ago (April 5, 2019, 12:58 a.m.)
Indexed	3 weeks, 5 days ago (July 28, 2025, 5:47 p.m.)
Issued	30 years, 9 months ago (Nov. 1, 1994)
Published	30 years, 9 months ago (Nov. 1, 1994)
Published Print	30 years, 9 months ago (Nov. 1, 1994)

Funders 0

None

BibTeX

@article{Bayle_1994, title={Quantitative analysis of the deformation and chemical profiles of strained multilayers}, volume={56}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/0304-3991(94)90149-x}, DOI={10.1016/0304-3991(94)90149-x}, number={1–3}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Bayle, P. and Deutsch, T. and Gilles, B. and Lançon, F. and Marty, A. and Thibault, J.}, year={1994}, month=nov, pages={94–107} }

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