Crossref journal-article
Elsevier BV
Ultramicroscopy (78)
Bibliography

Twesten, R. D., & Gibson, J. M. (1994). Kinematic analysis of transmission electron diffraction data from Si(111)-7 × 7. Ultramicroscopy, 53(3), 223–235.

Authors 2
  1. R.D. Twesten (first)
  2. J.M. Gibson (additional)
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Dates
Type When
Created 22 years, 10 months ago (Oct. 18, 2002, 7:43 p.m.)
Deposited 6 years, 4 months ago (April 5, 2019, 12:57 a.m.)
Indexed 2 years ago (Sept. 3, 2023, 1:53 a.m.)
Issued 31 years, 6 months ago (March 1, 1994)
Published 31 years, 6 months ago (March 1, 1994)
Published Print 31 years, 6 months ago (March 1, 1994)
Funders 0

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@article{Twesten_1994, title={Kinematic analysis of transmission electron diffraction data from Si(111)-7 × 7}, volume={53}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/0304-3991(94)90036-1}, DOI={10.1016/0304-3991(94)90036-1}, number={3}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Twesten, R.D. and Gibson, J.M.}, year={1994}, month=mar, pages={223–235} }