Crossref
journal-article
Elsevier BV
Ultramicroscopy (78)
References
38
Referenced
182
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 25, 2002, 10:16 p.m.) |
Deposited | 1 year, 9 months ago (Oct. 31, 2023, 3:31 a.m.) |
Indexed | 1 week ago (Aug. 23, 2025, 12:58 a.m.) |
Issued | 30 years, 4 months ago (April 1, 1995) |
Published | 30 years, 4 months ago (April 1, 1995) |
Published Print | 30 years, 4 months ago (April 1, 1995) |
@article{Hillyard_1995, title={Detector geometry, thermal diffuse scattering and strain effects in ADF STEM imaging}, volume={58}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/0304-3991(94)00173-k}, DOI={10.1016/0304-3991(94)00173-k}, number={1}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Hillyard, Sean and Silcox, John}, year={1995}, month=apr, pages={6–17} }