DOI: 10.1016/0304-3991(92)90040-q. Effect of specimen bias on secondary electron images in the STEM

Effect of specimen bias on secondary electron images in the STEM

10.1016/0304-3991(92)90040-q

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Walsh, C. A. (1992). Effect of specimen bias on secondary electron images in the STEM. Ultramicroscopy, 45(1), 85â93.

Authors 1

C.A. Walsh (first)

References 23 Referenced 10

10.1016/0304-3991(85)90091-9 / Ultramicroscopy by Imeson (1985)
{'key': '10.1016/0304-3991(92)90040-Q_BIB2', 'first-page': '99', 'volume': '78', 'author': 'Berger', 'year': '1985', 'journal-title': 'Inst. Phys. Conf. Ser.'} / Inst. Phys. Conf. Ser. by Berger (1985)
{'key': '10.1016/0304-3991(92)90040-Q_BIB3', 'first-page': '1957', 'volume': '2', 'author': 'Liu', 'year': '1988', 'journal-title': 'Scanning Microsc.'} / Scanning Microsc. by Liu (1988)
10.1016/0304-3991(89)90040-5 / Ultramicroscopy by Hembree (1989)
{'key': '10.1016/0304-3991(92)90040-Q_BIB5', 'series-title': 'Scanning Electron Microscopy', 'author': 'Reimer', 'year': '1985'} / Scanning Electron Microscopy by Reimer (1985)
10.1016/0039-6028(80)90276-9 / Surf. Sci. by Janssen (1980)
{'key': '10.1016/0304-3991(92)90040-Q_BIB7', 'first-page': '109', 'volume': '1', 'author': 'Harland', 'year': '1987', 'journal-title': 'Scanning Microsc. Suppl.'} / Scanning Microsc. Suppl. by Harland (1987)
10.1016/0039-6028(85)90657-0 / Surf. Sci. by Futamoto (1985)
{'key': '10.1016/0304-3991(92)90040-Q_BIB9', 'first-page': '191', 'article-title': 'EMAG-MICRO 89', 'volume': '98', 'author': 'Buglass', 'year': '1989', 'journal-title': 'Inst. Phys. Conf. Ser.'} / Inst. Phys. Conf. Ser. / EMAG-MICRO 89 by Buglass (1989)
10.1088/0022-3735/16/4/016 / J. Phys. E by Kruit (1983)
10.1016/0304-3991(88)90013-7 / Ultramicroscopy by Kruit (1988)
{'key': '10.1016/0304-3991(92)90040-Q_BIB12', 'series-title': 'PhD Thesis', 'author': 'Bleloch', 'year': '1989'} / PhD Thesis by Bleloch (1989)
10.1063/1.332840 / J. Appl. Phys. by Seiler (1983)
H. Müllejans, 1991, private communication. (10.1088/2058-7058/4/8/20)
10.1016/0304-3991(89)90240-4 / Ultramicroscopy by Bleloch (1989)
10.1016/0304-3991(91)90006-R / Ultramicroscopy by Liu (1991)
10.1016/S0081-1947(08)60728-6 / Solid State Phys. by Dekker (1958)
10.1007/BF01325850 / Z. Phys. by Suhrmann (1943)
10.1103/PhysRev.91.582 / Phys. Rev. by Johnson (1953)
{'key': '10.1016/0304-3991(92)90040-Q_BIB20', 'first-page': '1647', 'volume': '99', 'author': 'Lye', 'year': '1955', 'journal-title': 'Phys. Rev.'} / Phys. Rev. by Lye (1955)
{'key': '10.1016/0304-3991(92)90040-Q_BIB21', 'first-page': '217', 'article-title': 'EMAG 1987', 'volume': '90', 'author': 'Bleloch', 'year': '1987', 'journal-title': 'Inst. Phys. Conf. Ser.'} / Inst. Phys. Conf. Ser. / EMAG 1987 by Bleloch (1987)
{'key': '10.1016/0304-3991(92)90040-Q_BIB22', 'first-page': '93', 'volume': '24', 'author': 'Müllejans', 'year': '1991', 'journal-title': 'Beitr. Elektronenmikroskop. Direktabb. Oberfl.'} / Beitr. Elektronenmikroskop. Direktabb. Oberfl. by Müllejans (1991)
{'key': '10.1016/0304-3991(92)90040-Q_BIB23', 'first-page': '117', 'article-title': 'EMAG 91', 'volume': '119', 'author': 'Müllejans', 'year': '1991', 'journal-title': 'Inst. Phys. Conf. Ser.'} / Inst. Phys. Conf. Ser. / EMAG 91 by Müllejans (1991)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 3:43 p.m.)
Deposited	6 years, 4 months ago (April 4, 2019, 8:55 p.m.)
Indexed	1 year, 4 months ago (April 9, 2024, 3:58 a.m.)
Issued	33 years ago (Aug. 1, 1992)
Published	33 years ago (Aug. 1, 1992)
Published Print	33 years ago (Aug. 1, 1992)

Funders 0

None

BibTeX

@article{Walsh_1992, title={Effect of specimen bias on secondary electron images in the STEM}, volume={45}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/0304-3991(92)90040-q}, DOI={10.1016/0304-3991(92)90040-q}, number={1}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Walsh, C.A.}, year={1992}, month=aug, pages={85–93} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        4,
        9
      ]
    ],
    "date-time": "2024-04-09T07:58:32Z",
    "timestamp": 1712649512645
  },
  "reference-count": 23,
  "publisher": "Elsevier BV",
  "issue": "1",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            1992,
            8,
            1
          ]
        ],
        "date-time": "1992-08-01T00:00:00Z",
        "timestamp": 712627200000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1992,
        8
      ]
    ]
  },
  "DOI": "10.1016/0304-3991(92)90040-q",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        10,
        18
      ]
    ],
    "date-time": "2002-10-18T19:43:01Z",
    "timestamp": 1034970181000
  },
  "page": "85-93",
  "source": "Crossref",
  "is-referenced-by-count": 10,
  "title": "Effect of specimen bias on secondary electron images in the STEM",
  "prefix": "10.1016",
  "volume": "45",
  "author": [
    {
      "given": "C.A.",
      "family": "Walsh",
      "sequence": "first",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB1",
      "doi-asserted-by": "crossref",
      "first-page": "243",
      "DOI": "10.1016/0304-3991(85)90091-9",
      "volume": "17",
      "author": "Imeson",
      "year": "1985",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB2",
      "first-page": "99",
      "volume": "78",
      "author": "Berger",
      "year": "1985",
      "journal-title": "Inst. Phys. Conf. Ser."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB3",
      "first-page": "1957",
      "volume": "2",
      "author": "Liu",
      "year": "1988",
      "journal-title": "Scanning Microsc."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB4",
      "doi-asserted-by": "crossref",
      "first-page": "111",
      "DOI": "10.1016/0304-3991(89)90040-5",
      "volume": "31",
      "author": "Hembree",
      "year": "1989",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB5",
      "series-title": "Scanning Electron Microscopy",
      "author": "Reimer",
      "year": "1985"
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB6",
      "doi-asserted-by": "crossref",
      "first-page": "453",
      "DOI": "10.1016/0039-6028(80)90276-9",
      "volume": "93",
      "author": "Janssen",
      "year": "1980",
      "journal-title": "Surf. Sci."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB7",
      "first-page": "109",
      "volume": "1",
      "author": "Harland",
      "year": "1987",
      "journal-title": "Scanning Microsc. Suppl."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB8",
      "doi-asserted-by": "crossref",
      "first-page": "430",
      "DOI": "10.1016/0039-6028(85)90657-0",
      "volume": "150",
      "author": "Futamoto",
      "year": "1985",
      "journal-title": "Surf. Sci."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB9",
      "first-page": "191",
      "article-title": "EMAG-MICRO 89",
      "volume": "98",
      "author": "Buglass",
      "year": "1989",
      "journal-title": "Inst. Phys. Conf. Ser."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB10",
      "doi-asserted-by": "crossref",
      "first-page": "313",
      "DOI": "10.1088/0022-3735/16/4/016",
      "volume": "16",
      "author": "Kruit",
      "year": "1983",
      "journal-title": "J. Phys. E"
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB11",
      "doi-asserted-by": "crossref",
      "first-page": "183",
      "DOI": "10.1016/0304-3991(88)90013-7",
      "volume": "25",
      "author": "Kruit",
      "year": "1988",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB12",
      "series-title": "PhD Thesis",
      "author": "Bleloch",
      "year": "1989"
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB13",
      "doi-asserted-by": "crossref",
      "first-page": "R1",
      "DOI": "10.1063/1.332840",
      "volume": "54",
      "author": "Seiler",
      "year": "1983",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB14",
      "doi-asserted-by": "crossref",
      "unstructured": "H. M\u00fcllejans, 1991, private communication.",
      "DOI": "10.1088/2058-7058/4/8/20"
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB15",
      "doi-asserted-by": "crossref",
      "first-page": "147",
      "DOI": "10.1016/0304-3991(89)90240-4",
      "volume": "29",
      "author": "Bleloch",
      "year": "1989",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB16",
      "doi-asserted-by": "crossref",
      "first-page": "50",
      "DOI": "10.1016/0304-3991(91)90006-R",
      "volume": "37",
      "author": "Liu",
      "year": "1991",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB17",
      "doi-asserted-by": "crossref",
      "first-page": "251",
      "DOI": "10.1016/S0081-1947(08)60728-6",
      "volume": "6",
      "author": "Dekker",
      "year": "1958",
      "journal-title": "Solid State Phys."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB18",
      "doi-asserted-by": "crossref",
      "first-page": "363",
      "DOI": "10.1007/BF01325850",
      "volume": "120",
      "author": "Suhrmann",
      "year": "1943",
      "journal-title": "Z. Phys."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB19",
      "doi-asserted-by": "crossref",
      "first-page": "582",
      "DOI": "10.1103/PhysRev.91.582",
      "volume": "91",
      "author": "Johnson",
      "year": "1953",
      "journal-title": "Phys. Rev."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB20",
      "first-page": "1647",
      "volume": "99",
      "author": "Lye",
      "year": "1955",
      "journal-title": "Phys. Rev."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB21",
      "first-page": "217",
      "article-title": "EMAG 1987",
      "volume": "90",
      "author": "Bleloch",
      "year": "1987",
      "journal-title": "Inst. Phys. Conf. Ser."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB22",
      "first-page": "93",
      "volume": "24",
      "author": "M\u00fcllejans",
      "year": "1991",
      "journal-title": "Beitr. Elektronenmikroskop. Direktabb. Oberfl."
    },
    {
      "key": "10.1016/0304-3991(92)90040-Q_BIB23",
      "first-page": "117",
      "article-title": "EMAG 91",
      "volume": "119",
      "author": "M\u00fcllejans",
      "year": "1991",
      "journal-title": "Inst. Phys. Conf. Ser."
    }
  ],
  "container-title": "Ultramicroscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:030439919290040Q?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:030439919290040Q?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2019,
        4,
        5
      ]
    ],
    "date-time": "2019-04-05T00:55:13Z",
    "timestamp": 1554425713000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/030439919290040Q"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1992,
        8
      ]
    ]
  },
  "references-count": 23,
  "journal-issue": {
    "issue": "1",
    "published-print": {
      "date-parts": [
        [
          1992,
          8
        ]
      ]
    }
  },
  "alternative-id": [
    "030439919290040Q"
  ],
  "URL": "http://dx.doi.org/10.1016/0304-3991(92)90040-Q",
  "relation": {},
  "ISSN": [
    "0304-3991"
  ],
  "subject": [],
  "container-title-short": "Ultramicroscopy",
  "published": {
    "date-parts": [
      [
        1992,
        8
      ]
    ]
  }
}