DOI: 10.1016/0304-3991(89)90244-1. Elastic and inelastic scattering effects in reflection electron microscopy

Elastic and inelastic scattering effects in reflection electron microscopy

10.1016/0304-3991(89)90244-1

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Bleloch, A. L., Howie, A., Milne, R. H., & Walls, M. G. (1989). Elastic and inelastic scattering effects in reflection electron microscopy. Ultramicroscopy, 29(1â4), 175â182.

Authors 4

A.L. Bleloch (first)
A. Howie (additional)
R.H. Milne (additional)
M.G. Walls (additional)

References 34 Referenced 25

10.1016/0039-6028(81)90038-8 / Surface Sci. by Osakabe (1981)
10.1016/0039-6028(81)90493-3 / Surface Sci. by Osakabe (1981)
10.1107/S0021889887086916 / J. Appl. Cryst. by Yagi (1987)
10.1016/0039-6028(76)90230-2 / Surface Sci. by Højlund Nielsen (1976)
10.1016/0304-3991(83)90004-9 / Ultramicroscopy by Hsu (1983)
10.1016/0304-3991(83)90239-5 / Ultramicroscopy by Krivanek (1983)
10.1016/0304-3991(83)90229-2 / Ultramicroscopy by Howie (1983)
{'key': '10.1016/0304-3991(89)90244-1_BIB8', 'series-title': 'Inst. Phys. Conf. Ser. 78', 'first-page': '117', 'article-title': 'Electron Microscopy and Analysis 1985', 'author': 'Howie', 'year': '1986'} / Inst. Phys. Conf. Ser. 78 / Electron Microscopy and Analysis 1985 by Howie (1986)
10.1016/0039-6028(88)90449-9 / Surface Sci. by Wang (1988)
J.C.H. Spence, private communication.
10.1016/S0304-3991(76)92099-4 / Ultramicroscopy by Shuman (1977)
10.1016/0039-6028(81)90038-8 / Surface Sci. by Osakabe (1981)
10.1016/0739-6260(87)90053-0 / Micron Microsc. Acta by Peng (1987)
10.1016/0739-6260(87)90054-2 / Micron Microsc. Acta by Peng (1987)
10.1107/S0108767386098756 / Acta Cryst. by Peng (1986)
{'key': '10.1016/0304-3991(89)90244-1_BIB15', 'series-title': 'Inst. Phys. Conf. Ser. 78', 'first-page': '95', 'article-title': 'Electron Microscopy and Analysis 1985', 'author': 'Milne', 'year': '1986'} / Inst. Phys. Conf. Ser. 78 / Electron Microscopy and Analysis 1985 by Milne (1986)
{'key': '10.1016/0304-3991(89)90244-1_BIB16', 'series-title': 'Inst. Phys. Conf. Ser. 78', 'first-page': '181', 'article-title': 'Electron Microscopy and Analysis 1985', 'author': 'Milne', 'year': '1986'} / Inst. Phys. Conf. Ser. 78 / Electron Microscopy and Analysis 1985 by Milne (1986)
R.H. Milne, J. Microscopy, submitted.
10.1016/0304-3991(87)90064-7 / Ultramicroscopy by Ou (1987)
10.1002/pssa.2210230217 / Phys. Status Solidi (a) by Schmidt (1974)
{'key': '10.1016/0304-3991(89)90244-1_BIB20', 'series-title': 'Inst. Phys. Conf. Ser. 1', 'first-page': '17', 'article-title': 'Physical Basis of Yield and Fracture', 'author': 'Bethge', 'year': '1967'} / Inst. Phys. Conf. Ser. 1 / Physical Basis of Yield and Fracture by Bethge (1967)
10.1016/S0304-3991(85)80008-5 / Ultramicroscopy by Cowley (1985)
{'key': '10.1016/0304-3991(89)90244-1_BIB22', 'article-title': 'Proc. NATO ARW on RHEED and Reflection Imaging of Surfaces', 'author': 'Milne', 'year': '1988'} / Proc. NATO ARW on RHEED and Reflection Imaging of Surfaces by Milne (1988)
10.1107/S0567739470000074 / Acta Cryst. by Miyake (1970)
10.1016/0039-6028(86)90745-4 / Surface Sci. by Marten (1986)
10.1107/S0108767386098720 / Acta Cryst. by Lempfuhl (1986)
10.1016/0304-3991(87)90065-9 / Ultramicroscopy by Hsu (1987)
{'key': '10.1016/0304-3991(89)90244-1_BIB27', 'series-title': 'Inst. Phys. Conf. Ser. 90', 'first-page': '119', 'article-title': 'Electron Microscopy and Analysis 1987', 'author': 'Bird', 'year': '1988'} / Inst. Phys. Conf. Ser. 90 / Electron Microscopy and Analysis 1987 by Bird (1988)
{'key': '10.1016/0304-3991(89)90244-1_BIB28', 'article-title': 'Proc. NATO ARW on RHEED and Reflection Imaging of Surfaces', 'author': 'Bleloch', 'year': '1988'} / Proc. NATO ARW on RHEED and Reflection Imaging of Surfaces by Bleloch (1988)
10.1515/zna-1972-0303 / Z. Naturforsch. by Moon (1972)
10.1080/14786436808227313 / Phil. Mag. by Humphreys (1968)
10.1080/14786437708244948 / Phil. Mag. by Ritchie (1977)
10.1515/zna-1978-0304 / Z. Naturforsch. by Ichimiya (1978)
10.1515/zna-1980-0913 / Z. Naturforsch. by Voss (1980)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 7:43 p.m.)
Deposited	4 years, 2 months ago (May 29, 2021, 3:26 p.m.)
Indexed	1 year, 9 months ago (Oct. 23, 2023, 7:56 p.m.)
Issued	36 years, 3 months ago (May 1, 1989)
Published	36 years, 3 months ago (May 1, 1989)
Published Print	36 years, 3 months ago (May 1, 1989)

Funders 0

None

BibTeX

@article{Bleloch_1989, title={Elastic and inelastic scattering effects in reflection electron microscopy}, volume={29}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/0304-3991(89)90244-1}, DOI={10.1016/0304-3991(89)90244-1}, number={1–4}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Bleloch, A.L. and Howie, A. and Milne, R.H. and Walls, M.G.}, year={1989}, month=may, pages={175–182} }

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