DOI: 10.1016/0304-3991(89)90212-x. A fast preparation technique for high-quality plan view and cross-section TEM specimens of semiconducting materials

A fast preparation technique for high-quality plan view and cross-section TEM specimens of semiconducting materials

10.1016/0304-3991(89)90212-x

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Romano, A., Vanhellemont, J., Bender, H., & Morante, J. R. (1989). A fast preparation technique for high-quality plan view and cross-section TEM specimens of semiconducting materials. Ultramicroscopy, 31(2), 183â192.

Authors 4

A. Romano (first)
J. Vanhellemont (additional)
H. Bender (additional)
J.R. Morante (additional)

References 15 Referenced 54

{'key': '10.1016/0304-3991(89)90212-X_BIB1', 'first-page': '81', 'volume': '115', 'author': 'Boone', 'year': '1988'} by Boone (1988)
{'key': '10.1016/0304-3991(89)90212-X_BIB2', 'first-page': '143', 'volume': '115', 'author': 'Hetherington', 'year': '1988'} by Hetherington (1988)
10.1002/jemt.1060010106 / J. Electron Microsc. Tech. by Bravman (1984)
10.1063/1.1663778 / J. Appl. Phys. by Abrahams (1974)
{'key': '10.1016/0304-3991(89)90212-X_BIB5', 'first-page': '22', 'article-title': 'Transmission Electron Microscopy of Silicon VLSI Circuits and Structures', 'author': 'Marcus', 'year': '1983'} / Transmission Electron Microscopy of Silicon VLSI Circuits and Structures by Marcus (1983)
10.1016/0304-3991(83)90010-4 / Ultramicroscopy by Vanhellemont (1983)
{'key': '10.1016/0304-3991(89)90212-X_BIB7', 'first-page': '247', 'volume': '115', 'author': 'Vanhellemont', 'year': '1988'} by Vanhellemont (1988)
{'key': '10.1016/0304-3991(89)90212-X_BIB8', 'first-page': '241', 'volume': '115', 'author': 'De Veirman', 'year': '1988'} by De Veirman (1988)
{'key': '10.1016/0304-3991(89)90212-X_BIB9', 'first-page': '197', 'volume': 'E8', 'author': 'Kolbesen', 'year': '1975', 'journal-title': 'J. Phys.'} / J. Phys. by Kolbesen (1975)
{'key': '10.1016/0304-3991(89)90212-X_BIB10', 'first-page': '265', 'volume': '115', 'author': 'Ellington', 'year': '1988'} by Ellington (1988)
{'key': '10.1016/0304-3991(89)90212-X_BIB11', 'first-page': '179', 'volume': '115', 'author': 'Klepeis', 'year': '1988'} by Klepeis (1988)
{'key': '10.1016/0304-3991(89)90212-X_BIB12', 'first-page': '253', 'volume': '115', 'author': 'Wetzel', 'year': '1988'} by Wetzel (1988)
10.1002/jemt.1060110211 / J. Electron Microsc. Tech. by Madden (1989)
{'key': '10.1016/0304-3991(89)90212-X_BIB14', 'series-title': 'Inst. Phys. Conf. Ser. 76', 'first-page': '17', 'article-title': 'Microscopy of Semiconducting Materials 1985', 'author': 'Bender', 'year': '1985'} / Inst. Phys. Conf. Ser. 76 / Microscopy of Semiconducting Materials 1985 by Bender (1985)
10.1002/sia.740100406 / Surface Interface Anal. by Bulle-Lieuwma (1986)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 7:43 p.m.)
Deposited	6 years, 4 months ago (April 5, 2019, 12:50 a.m.)
Indexed	1 year, 2 months ago (June 17, 2024, 11:08 a.m.)
Issued	35 years, 10 months ago (Oct. 1, 1989)
Published	35 years, 10 months ago (Oct. 1, 1989)
Published Print	35 years, 10 months ago (Oct. 1, 1989)

Funders 0

None

BibTeX

@article{Romano_1989, title={A fast preparation technique for high-quality plan view and cross-section TEM specimens of semiconducting materials}, volume={31}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/0304-3991(89)90212-x}, DOI={10.1016/0304-3991(89)90212-x}, number={2}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Romano, A. and Vanhellemont, J. and Bender, H. and Morante, J.R.}, year={1989}, month=oct, pages={183–192} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        6,
        17
      ]
    ],
    "date-time": "2024-06-17T15:08:43Z",
    "timestamp": 1718636923859
  },
  "reference-count": 15,
  "publisher": "Elsevier BV",
  "issue": "2",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            1989,
            10,
            1
          ]
        ],
        "date-time": "1989-10-01T00:00:00Z",
        "timestamp": 623203200000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1989,
        10
      ]
    ]
  },
  "DOI": "10.1016/0304-3991(89)90212-x",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        10,
        18
      ]
    ],
    "date-time": "2002-10-18T23:43:01Z",
    "timestamp": 1034984581000
  },
  "page": "183-192",
  "source": "Crossref",
  "is-referenced-by-count": 54,
  "title": "A fast preparation technique for high-quality plan view and cross-section TEM specimens of semiconducting materials",
  "prefix": "10.1016",
  "volume": "31",
  "author": [
    {
      "given": "A.",
      "family": "Romano",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "J.",
      "family": "Vanhellemont",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "H.",
      "family": "Bender",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "J.R.",
      "family": "Morante",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB1",
      "first-page": "81",
      "volume": "115",
      "author": "Boone",
      "year": "1988"
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB2",
      "first-page": "143",
      "volume": "115",
      "author": "Hetherington",
      "year": "1988"
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB3",
      "doi-asserted-by": "crossref",
      "first-page": "53",
      "DOI": "10.1002/jemt.1060010106",
      "volume": "1",
      "author": "Bravman",
      "year": "1984",
      "journal-title": "J. Electron Microsc. Tech."
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB4",
      "doi-asserted-by": "crossref",
      "first-page": "3315",
      "DOI": "10.1063/1.1663778",
      "volume": "45",
      "author": "Abrahams",
      "year": "1974",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB5",
      "first-page": "22",
      "article-title": "Transmission Electron Microscopy of Silicon VLSI Circuits and Structures",
      "author": "Marcus",
      "year": "1983"
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB6",
      "doi-asserted-by": "crossref",
      "first-page": "303",
      "DOI": "10.1016/0304-3991(83)90010-4",
      "volume": "11",
      "author": "Vanhellemont",
      "year": "1983",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB7",
      "first-page": "247",
      "volume": "115",
      "author": "Vanhellemont",
      "year": "1988"
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB8",
      "first-page": "241",
      "volume": "115",
      "author": "De Veirman",
      "year": "1988"
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB9",
      "first-page": "197",
      "volume": "E8",
      "author": "Kolbesen",
      "year": "1975",
      "journal-title": "J. Phys."
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB10",
      "first-page": "265",
      "volume": "115",
      "author": "Ellington",
      "year": "1988"
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB11",
      "first-page": "179",
      "volume": "115",
      "author": "Klepeis",
      "year": "1988"
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB12",
      "first-page": "253",
      "volume": "115",
      "author": "Wetzel",
      "year": "1988"
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB13",
      "doi-asserted-by": "crossref",
      "first-page": "161",
      "DOI": "10.1002/jemt.1060110211",
      "volume": "11",
      "author": "Madden",
      "year": "1989",
      "journal-title": "J. Electron Microsc. Tech."
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB14",
      "series-title": "Inst. Phys. Conf. Ser. 76",
      "first-page": "17",
      "article-title": "Microscopy of Semiconducting Materials 1985",
      "author": "Bender",
      "year": "1985"
    },
    {
      "key": "10.1016/0304-3991(89)90212-X_BIB15",
      "doi-asserted-by": "crossref",
      "first-page": "210",
      "DOI": "10.1002/sia.740100406",
      "volume": "10",
      "author": "Bulle-Lieuwma",
      "year": "1986",
      "journal-title": "Surface Interface Anal."
    }
  ],
  "container-title": "Ultramicroscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:030439918990212X?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:030439918990212X?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2019,
        4,
        5
      ]
    ],
    "date-time": "2019-04-05T04:50:30Z",
    "timestamp": 1554439830000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/030439918990212X"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1989,
        10
      ]
    ]
  },
  "references-count": 15,
  "journal-issue": {
    "issue": "2",
    "published-print": {
      "date-parts": [
        [
          1989,
          10
        ]
      ]
    }
  },
  "alternative-id": [
    "030439918990212X"
  ],
  "URL": "http://dx.doi.org/10.1016/0304-3991(89)90212-X",
  "relation": {},
  "ISSN": [
    "0304-3991"
  ],
  "subject": [],
  "container-title-short": "Ultramicroscopy",
  "published": {
    "date-parts": [
      [
        1989,
        10
      ]
    ]
  }
}