DOI: 10.1016/0304-3991(89)90040-5. Biassed secondary electron imaging in a UHV-STEM

Biassed secondary electron imaging in a UHV-STEM

10.1016/0304-3991(89)90040-5

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Hembree, G. G., Crozier, P. A., Drucker, J. S., Krishnamurthy, M., Venables, J. A., & Cowley, J. M. (1989). Biassed secondary electron imaging in a UHV-STEM. Ultramicroscopy, 31(1), 111â115.

Authors 6

G.G. Hembree (first)
P.A. Crozier (additional)
J.S. Drucker (additional)
M. Krishnamurthy (additional)
J.A. Venables (additional)
J.M. Cowley (additional)

References 11 Referenced 64

10.1098/rsta.1986.0074 / Phil. Trans. Roy. Soc. London by Venables (1986)
10.1016/0039-6028(87)90164-6 / Surface Sci. by Venables (1987)
10.1107/S0021889887086916 / J. Appl. Cryst. by Yagi (1987)
{'year': '1988', 'series-title': 'Proc. NATO-ARW on Evaluation of Advanced Semiconductor Materials by Electron Microscopy', 'author': 'Venables', 'key': '10.1016/0304-3991(89)90040-5_BIB4'} / Proc. NATO-ARW on Evaluation of Advanced Semiconductor Materials by Electron Microscopy by Venables (1988)
{'key': '10.1016/0304-3991(89)90040-5_BIB5', 'first-page': '85', 'article-title': 'Electron Microscopy and Analysis 1987', 'volume': '90', 'author': 'Venables', 'year': '1988'} / Electron Microscopy and Analysis 1987 by Venables (1988)
10.1016/0039-6028(88)90449-9 / Surface Sci. by Wang (1988)
10.1016/0304-3991(88)90013-7 / Ultramicroscopy by Kruit (1988)
10.1016/0039-6028(85)90657-0 / Surface Sci. by Futamoto (1985)
{'key': '10.1016/0304-3991(89)90040-5_BIB9', 'first-page': '109', 'volume': '1', 'author': 'Harland', 'year': '1987', 'journal-title': 'Scanning Microscopy Suppl.'} / Scanning Microscopy Suppl. by Harland (1987)
10.1016/0304-3991(85)90091-9 / Ultramicroscopy by Imeson (1985)
{'key': '10.1016/0304-3991(89)90040-5_BIB11', 'series-title': 'Proc. 46th Annual EMSA Meeting', 'first-page': '666', 'author': 'Hembree', 'year': '1988'} / Proc. 46th Annual EMSA Meeting by Hembree (1988)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 7:43 p.m.)
Deposited	6 years, 5 months ago (April 5, 2019, 12:50 a.m.)
Indexed	11 months, 3 weeks ago (Sept. 15, 2024, 10:02 p.m.)
Issued	36 years ago (Sept. 1, 1989)
Published	36 years ago (Sept. 1, 1989)
Published Print	36 years ago (Sept. 1, 1989)

Funders 0

None

BibTeX

@article{Hembree_1989, title={Biassed secondary electron imaging in a UHV-STEM}, volume={31}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/0304-3991(89)90040-5}, DOI={10.1016/0304-3991(89)90040-5}, number={1}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Hembree, G.G. and Crozier, P.A. and Drucker, J.S. and Krishnamurthy, M. and Venables, J.A. and Cowley, J.M.}, year={1989}, month=sep, pages={111–115} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        9,
        16
      ]
    ],
    "date-time": "2024-09-16T02:02:36Z",
    "timestamp": 1726452156627
  },
  "reference-count": 11,
  "publisher": "Elsevier BV",
  "issue": "1",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            1989,
            9,
            1
          ]
        ],
        "date-time": "1989-09-01T00:00:00Z",
        "timestamp": 620611200000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        1989,
        9
      ]
    ]
  },
  "DOI": "10.1016/0304-3991(89)90040-5",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        10,
        18
      ]
    ],
    "date-time": "2002-10-18T23:43:01Z",
    "timestamp": 1034984581000
  },
  "page": "111-115",
  "source": "Crossref",
  "is-referenced-by-count": 64,
  "title": "Biassed secondary electron imaging in a UHV-STEM",
  "prefix": "10.1016",
  "volume": "31",
  "author": [
    {
      "given": "G.G.",
      "family": "Hembree",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "P.A.",
      "family": "Crozier",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "J.S.",
      "family": "Drucker",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "M.",
      "family": "Krishnamurthy",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "J.A.",
      "family": "Venables",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "J.M.",
      "family": "Cowley",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/0304-3991(89)90040-5_BIB1",
      "doi-asserted-by": "crossref",
      "first-page": "243",
      "DOI": "10.1098/rsta.1986.0074",
      "volume": "A318",
      "author": "Venables",
      "year": "1986",
      "journal-title": "Phil. Trans. Roy. Soc. London"
    },
    {
      "key": "10.1016/0304-3991(89)90040-5_BIB2",
      "doi-asserted-by": "crossref",
      "first-page": "235",
      "DOI": "10.1016/0039-6028(87)90164-6",
      "volume": "181",
      "author": "Venables",
      "year": "1987",
      "journal-title": "Surface Sci."
    },
    {
      "key": "10.1016/0304-3991(89)90040-5_BIB3",
      "doi-asserted-by": "crossref",
      "first-page": "147",
      "DOI": "10.1107/S0021889887086916",
      "volume": "20",
      "author": "Yagi",
      "year": "1987",
      "journal-title": "J. Appl. Cryst."
    },
    {
      "year": "1988",
      "series-title": "Proc. NATO-ARW on Evaluation of Advanced Semiconductor Materials by Electron Microscopy",
      "author": "Venables",
      "key": "10.1016/0304-3991(89)90040-5_BIB4"
    },
    {
      "key": "10.1016/0304-3991(89)90040-5_BIB5",
      "first-page": "85",
      "article-title": "Electron Microscopy and Analysis 1987",
      "volume": "90",
      "author": "Venables",
      "year": "1988"
    },
    {
      "key": "10.1016/0304-3991(89)90040-5_BIB6",
      "doi-asserted-by": "crossref",
      "first-page": "501",
      "DOI": "10.1016/0039-6028(88)90449-9",
      "volume": "193",
      "author": "Wang",
      "year": "1988",
      "journal-title": "Surface Sci."
    },
    {
      "key": "10.1016/0304-3991(89)90040-5_BIB7",
      "doi-asserted-by": "crossref",
      "first-page": "183",
      "DOI": "10.1016/0304-3991(88)90013-7",
      "volume": "25",
      "author": "Kruit",
      "year": "1988",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/0304-3991(89)90040-5_BIB8",
      "doi-asserted-by": "crossref",
      "first-page": "430",
      "DOI": "10.1016/0039-6028(85)90657-0",
      "volume": "150",
      "author": "Futamoto",
      "year": "1985",
      "journal-title": "Surface Sci."
    },
    {
      "key": "10.1016/0304-3991(89)90040-5_BIB9",
      "first-page": "109",
      "volume": "1",
      "author": "Harland",
      "year": "1987",
      "journal-title": "Scanning Microscopy Suppl."
    },
    {
      "key": "10.1016/0304-3991(89)90040-5_BIB10",
      "doi-asserted-by": "crossref",
      "first-page": "243",
      "DOI": "10.1016/0304-3991(85)90091-9",
      "volume": "17",
      "author": "Imeson",
      "year": "1985",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/0304-3991(89)90040-5_BIB11",
      "series-title": "Proc. 46th Annual EMSA Meeting",
      "first-page": "666",
      "author": "Hembree",
      "year": "1988"
    }
  ],
  "container-title": "Ultramicroscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:0304399189900405?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:0304399189900405?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2019,
        4,
        5
      ]
    ],
    "date-time": "2019-04-05T04:50:21Z",
    "timestamp": 1554439821000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/0304399189900405"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1989,
        9
      ]
    ]
  },
  "references-count": 11,
  "journal-issue": {
    "issue": "1",
    "published-print": {
      "date-parts": [
        [
          1989,
          9
        ]
      ]
    }
  },
  "alternative-id": [
    "0304399189900405"
  ],
  "URL": "http://dx.doi.org/10.1016/0304-3991(89)90040-5",
  "relation": {},
  "ISSN": [
    "0304-3991"
  ],
  "subject": [],
  "container-title-short": "Ultramicroscopy",
  "published": {
    "date-parts": [
      [
        1989,
        9
      ]
    ]
  }
}