10.1016/0304-3991(85)90082-8
Crossref journal-article
Elsevier BV
Ultramicroscopy (78)
Bibliography

Echenique, P. M., & Howie, A. (1985). Image force effects in electron microscopy. Ultramicroscopy, 16(2), 269–272.

Authors 2
  1. P.M. Echenique (first)
  2. A. Howie (additional)
References 13 Referenced 52
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  8. 10.1016/0304-3991(82)90272-8 / Ultramicroscopy by Cowley (1982)
  9. 10.1016/0038-1098(82)90979-6 / Solid State Commun. by Marks (1982)
  10. 10.1103/PhysRevB.23.6486 / Phys. Rev. by Echenique (1981)
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  12. 10.1016/0039-6028(77)90068-1 / Surface Sci. by Muscat (1977)
  13. 10.1016/0304-3991(83)90229-2 / Ultramicroscopy by Howie (1983)
Dates
Type When
Created 22 years, 10 months ago (Oct. 18, 2002, 8:28 p.m.)
Deposited 6 years, 4 months ago (April 5, 2019, 12:21 a.m.)
Indexed 1 year, 11 months ago (Sept. 13, 2023, 10:04 p.m.)
Issued 40 years, 7 months ago (Jan. 1, 1985)
Published 40 years, 7 months ago (Jan. 1, 1985)
Published Print 40 years, 7 months ago (Jan. 1, 1985)
Funders 0

None

@article{Echenique_1985, title={Image force effects in electron microscopy}, volume={16}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/0304-3991(85)90082-8}, DOI={10.1016/0304-3991(85)90082-8}, number={2}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Echenique, P.M. and Howie, A.}, year={1985}, month=jan, pages={269–272} }