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Ultramicroscopy (78)
Bibliography

Berriman, J., Bryan, R. K., Freeman, R., & Leonard, K. R. (1984). Methods for specimen thickness determination in electron microscopy. Ultramicroscopy, 13(4), 351–364.

Authors 4
  1. J. Berriman (first)
  2. R.K. Bryan (additional)
  3. R. Freeman (additional)
  4. K.R. Leonard (additional)
References 19 Referenced 41
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Dates
Type When
Created 22 years, 10 months ago (Oct. 18, 2002, 8:28 p.m.)
Deposited 5 years, 5 months ago (March 10, 2020, 7:15 p.m.)
Indexed 1 year, 4 months ago (April 9, 2024, 10:10 p.m.)
Issued 41 years, 7 months ago (Jan. 1, 1984)
Published 41 years, 7 months ago (Jan. 1, 1984)
Published Print 41 years, 7 months ago (Jan. 1, 1984)
Funders 0

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@article{Berriman_1984, title={Methods for specimen thickness determination in electron microscopy}, volume={13}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/0304-3991(84)90001-9}, DOI={10.1016/0304-3991(84)90001-9}, number={4}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Berriman, J. and Bryan, R.K. and Freeman, R. and Leonard, K.R.}, year={1984}, month=jan, pages={351–364} }