DOI: 10.1016/0304-3991(83)90006-2. The importance of beam alignment and crystal tilt in high resolution electron microscopy

The importance of beam alignment and crystal tilt in high resolution electron microscopy

10.1016/0304-3991(83)90006-2

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Smith, D. J., Saxton, W. O., OâKeefe, M. A., Wood, G. J., & Stobbs, W. M. (1983). The importance of beam alignment and crystal tilt in high resolution electron microscopy. Ultramicroscopy, 11(4), 263â281.

Authors 5

David J. Smith (first)
W.O. Saxton (additional)
M.A. O'Keefe (additional)
G.J. Wood (additional)
W.M. Stobbs (additional)

References 30 Referenced 160

10.1179/isr.1981.6.2.155 / Interdisciplinary Sci. Rev. by Smith (1981)
10.1107/S056773947400057X / Acta Cryst. by Goodman (1974)
10.1016/0304-3991(83)90053-0 / Ultramicroscopy by Self (1983)
10.1016/0304-3991(82)90272-8 / Ultramicroscopy by Cowley (1982)
{'key': '10.1016/0304-3991(83)90006-2_BIB5', 'first-page': '130', 'volume': 'Vol. 3', 'author': 'Iijima', 'year': '1978'} by Iijima (1978)
10.1016/S0304-3991(78)80006-0 / Ultramicroscopy by Zemlin (1978)
10.1016/S0304-3991(79)90301-2 / Ultramicroscopy by Zemlin (1979)
{'key': '10.1016/0304-3991(83)90006-2_BIB8', 'first-page': '1', 'volume': '50', 'author': 'Wade', 'year': '1978', 'journal-title': 'Optik'} / Optik by Wade (1978)
{'key': '10.1016/0304-3991(83)90006-2_BIB9', 'first-page': '9', 'article-title': 'Computer Techniques for Image Processing in Electron Microscopy', 'author': 'Saxton', 'year': '1978'} / Computer Techniques for Image Processing in Electron Microscopy by Saxton (1978)
10.1016/0304-3991(80)90012-1 / Ultramicroscopy by Hawkes (1980)
{'key': '10.1016/0304-3991(83)90006-2_BIB11', 'series-title': 'Proc. 37th Annual EMSA Meeting', 'first-page': '556', 'author': "O'Keefe", 'year': '1979'} / Proc. 37th Annual EMSA Meeting by O'Keefe (1979)
{'key': '10.1016/0304-3991(83)90006-2_BIB12', 'first-page': '661', 'volume': '5', 'author': 'Saxton', 'year': '1980', 'journal-title': 'J. Microsc. Spectrosc. Electron.'} / J. Microsc. Spectrosc. Electron. by Saxton (1980)
10.1111/j.1365-2818.1983.tb04183.x / J. Microscopy by Wood (1983)
10.1111/j.1365-2818.1983.tb04211.x / J. Microscopy by Smith (1983)
10.1107/S0365110X61001996 / Acta Cryst. by Wadsley (1961)
10.1063/1.1660042 / J. Appl. Phys. by Iijima (1971)
10.1107/S0567739475000654 / Acta Cryst. by O'Keefe (1975)
10.1515/zna-1972-0312 / Z. Naturforsch. by Cowley (1972)
{'key': '10.1016/0304-3991(83)90006-2_BIB19', 'first-page': '251', 'volume': 'Vol. 1', 'author': 'Wyckoff', 'year': '1963'} by Wyckoff (1963)
10.1088/0950-7671/24/3/302 / J. Sci. Instr. by Haine (1947)
{'key': '10.1016/0304-3991(83)90006-2_BIB21', 'first-page': '397', 'volume': '11', 'author': 'Leisegang', 'year': '1954', 'journal-title': 'Optik'} / Optik by Leisegang (1954)
{'key': '10.1016/0304-3991(83)90006-2_BIB22', 'first-page': '641', 'volume': '22', 'author': 'Kanaya', 'year': '1958', 'journal-title': 'Bull. Electrotech. Lab.'} / Bull. Electrotech. Lab. by Kanaya (1958)
{'key': '10.1016/0304-3991(83)90006-2_BIB23', 'first-page': '397', 'volume': '24', 'author': 'Riecke', 'year': '1966', 'journal-title': 'Optik'} / Optik by Riecke (1966)
{'key': '10.1016/0304-3991(83)90006-2_BIB24', 'first-page': '113', 'volume': '34', 'author': 'Heinemann', 'year': '1971', 'journal-title': 'Optik'} / Optik by Heinemann (1971)
10.1016/S0304-3991(76)90263-1 / Ultramicroscopy by Budinger (1976)
{'key': '10.1016/0304-3991(83)90006-2_BIB26', 'first-page': '527', 'volume': 'Vol. 1', 'author': 'Saxton', 'year': '1982'} by Saxton (1982)
10.1111/j.1365-2818.1983.tb04217.x / J. Microscopy by Saxton (1983)
{'key': '10.1016/0304-3991(83)90006-2_BIB28', 'series-title': 'Electron Microscopy and Analysis 1981', 'first-page': '123', 'author': 'Catto', 'year': '1982'} / Electron Microscopy and Analysis 1981 by Catto (1982)
{'key': '10.1016/0304-3991(83)90006-2_BIB29', 'series-title': 'Proc. 41st Annual EMSA Meeting', 'author': 'Wood', 'year': '1983'} / Proc. 41st Annual EMSA Meeting by Wood (1983)
10.1111/j.1365-2818.1982.tb00429.x / J. Microscopy by Boyes (1982)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 8:28 p.m.)
Deposited	5 years, 5 months ago (March 10, 2020, 7:15 p.m.)
Indexed	3 months ago (May 21, 2025, 1:51 a.m.)
Issued	42 years, 7 months ago (Jan. 1, 1983)
Published	42 years, 7 months ago (Jan. 1, 1983)
Published Print	42 years, 7 months ago (Jan. 1, 1983)

Funders 0

None

BibTeX

@article{Smith_1983, title={The importance of beam alignment and crystal tilt in high resolution electron microscopy}, volume={11}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/0304-3991(83)90006-2}, DOI={10.1016/0304-3991(83)90006-2}, number={4}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Smith, David J. and Saxton, W.O. and O’Keefe, M.A. and Wood, G.J. and Stobbs, W.M.}, year={1983}, month=jan, pages={263–281} }

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