Crossref
journal-article
Elsevier BV
Applied Surface Science (78)
References
22
Referenced
209
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 12:35 a.m.) |
Deposited | 6 years, 4 months ago (April 12, 2019, 1:27 a.m.) |
Indexed | 1 month, 4 weeks ago (July 2, 2025, 1:50 p.m.) |
Issued | 29 years, 1 month ago (Aug. 1, 1996) |
Published | 29 years, 1 month ago (Aug. 1, 1996) |
Published Print | 29 years, 1 month ago (Aug. 1, 1996) |
@article{Kasrai_1996, title={Sampling depth of total electron and fluorescence measurements in Si L- and K-edge absorption spectroscopy}, volume={99}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/0169-4332(96)00454-0}, DOI={10.1016/0169-4332(96)00454-0}, number={4}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Kasrai, M. and Lennard, W.N. and Brunner, R.W. and Bancroft, G.M. and Bardwell, J.A. and Tan, K.H.}, year={1996}, month=aug, pages={303–312} }