Crossref journal-article
Elsevier BV
Applied Surface Science (78)
Bibliography

Kasrai, M., Lennard, W. N., Brunner, R. W., Bancroft, G. M., Bardwell, J. A., & Tan, K. H. (1996). Sampling depth of total electron and fluorescence measurements in Si L- and K-edge absorption spectroscopy. Applied Surface Science, 99(4), 303–312.

Authors 6
  1. M. Kasrai (first)
  2. W.N. Lennard (additional)
  3. R.W. Brunner (additional)
  4. G.M. Bancroft (additional)
  5. J.A. Bardwell (additional)
  6. K.H. Tan (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 12:35 a.m.)
Deposited 6 years, 4 months ago (April 12, 2019, 1:27 a.m.)
Indexed 1 month, 4 weeks ago (July 2, 2025, 1:50 p.m.)
Issued 29 years, 1 month ago (Aug. 1, 1996)
Published 29 years, 1 month ago (Aug. 1, 1996)
Published Print 29 years, 1 month ago (Aug. 1, 1996)
Funders 0

None

@article{Kasrai_1996, title={Sampling depth of total electron and fluorescence measurements in Si L- and K-edge absorption spectroscopy}, volume={99}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/0169-4332(96)00454-0}, DOI={10.1016/0169-4332(96)00454-0}, number={4}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Kasrai, M. and Lennard, W.N. and Brunner, R.W. and Bancroft, G.M. and Bardwell, J.A. and Tan, K.H.}, year={1996}, month=aug, pages={303–312} }