DOI: 10.1016/0169-4332(96)00302-9. Structural fluctuation of SiO2 network at the interface with Si

Structural fluctuation of SiO2 network at the interface with Si

10.1016/0169-4332(96)00302-9

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Sugita, Y., Watanabe, S., Awaji, N., & Komiya, S. (1996). Structural fluctuation of SiO2 network at the interface with Si. Applied Surface Science, 100â101, 268â271.

Authors 4

Y. Sugita (first)
S. Watanabe (additional)
N. Awaji (additional)
S. Komiya (additional)

References 27 Referenced 34

10.1116/1.569413 / J. Vac. Sci. Technol. by Pliskin (1977)
10.1149/1.2131600 / J. Electrochem. Soc. by Traft (1978)
10.1149/1.2129805 / J. Electrochem. Soc. by Traft (1980)
10.1149/1.2123617 / J. Electrochem. Soc. by Irene (1982)
10.1149/1.2069429 / J. Electrochem. Soc. by Yakovlev (1992)
10.1116/1.578166 / J. Vac. Sci. Technol. A by Yakovlev (1992)
{'key': '10.1016/0169-4332(96)00302-9_bib4', 'first-page': '139', 'author': 'Helms', 'year': '1988'} by Helms (1988)
10.1103/PhysRevLett.70.1723 / Phys. Rev. Lett. by Stesmans (1993)
10.1063/1.339320 / J. Appl. Phys. by Boyd (1987)
10.1116/1.583944 / J. Vac. Sci. Technol. B by Lucovsky (1987)
10.1063/1.359394 / J. Appl. Phys. by Bjorkman (1995)
K. Ishikawa, H. Ogawa, S. Oshida, K. Suzuki and S. Fujimura, Ext. Abst. Conf. 1995 Solid State Dev. and Mater., Japan.
{'key': '10.1016/0169-4332(96)00302-9_bib10', 'series-title': 'Ext. Abst. Conf. 1993 Solid State Dev. and Mater.', 'first-page': '86', 'author': 'Yasuda', 'year': '1993'} / Ext. Abst. Conf. 1993 Solid State Dev. and Mater. by Yasuda (1993)
10.1103/PhysRev.130.2193 / Phys. Rev. by Berreman (1963)
10.1063/1.1145978 / Rev. Sci. Instr. by Horii (1995)
10.1364/AO.23.001794 / Appl. Opt. by Vidal (1984)
10.1051/rphysap:01980001503076100 / Rev. Phys. Appl. by Nevot (1980)
10.1103/PhysRev.95.359 / Phys. Rev. by Paratt (1954)
10.1116/1.576803 / J. Vac. Sci. Technol. A by Bright (1990)
{'key': '10.1016/0169-4332(96)00302-9_bib17', 'author': 'Henke', 'year': '1988', 'journal-title': 'Lawrence Berkeley Lab. Rep. LBL-26259'} / Lawrence Berkeley Lab. Rep. LBL-26259 by Henke (1988)
{'key': '10.1016/0169-4332(96)00302-9_bib18', 'volume': '88-14', 'author': 'Sasaki', 'year': '1989', 'journal-title': 'KEK Rep.'} / KEK Rep. by Sasaki (1989)
N. Awaji, in preparation for publication in Jpn. J. Appl. Phys.
10.1143/JJAP.34.L1013 / Jpn. J. Appl. Phys. by Awaji (1995)
10.1063/1.458239 / J. Chem. Phys. by Walrafen (1990)
10.1116/1.575047 / J. Vac. Sci. Technol. A by Devine (1988)
10.1103/PhysRevB.15.4030 / Phys. Rev. B by Sen (1977)
10.1063/1.324517 / J. Appl. Phys. by Jorgensen (1978)

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 6:46 a.m.)
Deposited	6 years, 4 months ago (April 27, 2019, 4:59 p.m.)
Indexed	3 months, 3 weeks ago (May 6, 2025, 5:08 a.m.)
Issued	29 years, 1 month ago (July 1, 1996)
Published	29 years, 1 month ago (July 1, 1996)
Published Print	29 years, 1 month ago (July 1, 1996)

Funders 0

None

BibTeX

@article{Sugita_1996, title={Structural fluctuation of SiO2 network at the interface with Si}, volume={100–101}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/0169-4332(96)00302-9}, DOI={10.1016/0169-4332(96)00302-9}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Sugita, Y. and Watanabe, S. and Awaji, N. and Komiya, S.}, year={1996}, month=jul, pages={268–271} }

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