DOI: 10.1016/0169-4332(96)00110-9. AFM and STM studies on In2O3 and ITO thin films deposited by atomic layer epitaxy

AFM and STM studies on In2O3 and ITO thin films deposited by atomic layer epitaxy

10.1016/0169-4332(96)00110-9

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Asikainen, T., Ritala, M., LeskelÃ¤, M., Prohaska, T., Friedbacher, G., & Grasserbauer, M. (1996). AFM and STM studies on In2O3 and ITO thin films deposited by atomic layer epitaxy. Applied Surface Science, 99(2), 91â98.

Authors 6

Timo Asikainen (first)
Mikko Ritala (additional)
Markku Leskelä (additional)
Thomas Prohaska (additional)
Gernot Friedbacher (additional)
Manfred Grasserbauer (additional)

References 16 Referenced 39

10.1016/S0920-2307(89)80006-4 / Mater. Sci. Rep. by Suntola (1989)
10.1007/BF02403106 / J. Mater. Sci. by Dawar (1984)
10.1016/0040-6090(83)90256-0 / Thin Solid Films by Chopra (1983)
10.1149/1.2059303 / J. Electrochem. Soc. by Asikainen (1994)
10.1149/1.2050018 / J. Electrochem. Soc. by Asikainen (1995)
10.1016/0040-6090(92)90874-B / Thin Solid Films by Suntola (1992)
10.1016/0040-6090(93)90762-E / Thin Solid Films by Ylilammi (1993)
Digital Instruments, 520 E Montecito Street, Santa Barbara, CA 93103, USA.
Joint Commitee on Powder Diffraction Standards, Card 6–416, JCPDS International Center for Diffraction Data, Swarthmore, USA.
10.1016/0040-6090(93)90557-6 / Thin Solid Films by Ritala (1993)
10.1016/0040-6090(94)90168-6 / Thin Solid Films by Ritala (1994)
10.1016/0040-6090(94)90754-4 / Thin Solid Films by Ritala (1994)
J. Ihanus, M. Ritala, M. Leskelä, T. Prohaska, R. Resch, G. Friedbacher and M. Grasserbauer, to be published.
M. Ritala, H. Saloniemi, M. Leskelä, T. Prohaska, G. Friedbacher and M. Grasserbauer, Thin Solid Films, in press.
{'key': '10.1016/0169-4332(96)00110-9_BIB15', 'year': '1993'} (1993)
10.1016/0040-6090(94)90752-8 / Thin Solid Films by Viirola (1994)

Dates

Type	When
Created	23 years, 1 month ago (July 25, 2002, 7:18 a.m.)
Deposited	6 years, 3 months ago (May 1, 2019, 8:23 p.m.)
Indexed	1 year, 1 month ago (July 16, 2024, 11 p.m.)
Issued	29 years, 3 months ago (June 1, 1996)
Published	29 years, 3 months ago (June 1, 1996)
Published Print	29 years, 3 months ago (June 1, 1996)

Funders 0

None

BibTeX

@article{Asikainen_1996, title={AFM and STM studies on In2O3 and ITO thin films deposited by atomic layer epitaxy}, volume={99}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/0169-4332(96)00110-9}, DOI={10.1016/0169-4332(96)00110-9}, number={2}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Asikainen, Timo and Ritala, Mikko and Leskelä, Markku and Prohaska, Thomas and Friedbacher, Gernot and Grasserbauer, Manfred}, year={1996}, month=jun, pages={91–98} }

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