Crossref
journal-article
Elsevier BV
Applied Surface Science (78)
References
9
Referenced
8
10.1016/0304-3991(89)90336-7
/ Ultramicroscopy by Stocker (1989)10.1103/PhysRevLett.65.1204
/ Phys. Rev. Lett. by Fink (1990)10.1088/0031-8949/38/2/029
/ Phys. Scr. by Fink (1988)10.1016/0304-3991(86)90193-2
/ Ultramicroscopy by Lichte (1986){'key': '10.1016/0169-4332(93)90350-K_BIB4_1', 'first-page': '129', 'article-title': 'Field Ion Microscopy, Principle and Applications', 'author': 'Mueller', 'year': '1969'}
/ Field Ion Microscopy, Principle and Applications by Mueller (1969)10.1088/0022-3735/12/5/005
/ J. Phys. E by Melmed (1979)10.1116/1.568497
/ J. Vac. Sci. Technol. by Orloff (1975){'key': '10.1016/0169-4332(93)90350-K_BIB6', 'series-title': 'Proc. 29th Int. Field. Emission Symp.', 'author': 'Ernst', 'year': '1982'}
/ Proc. 29th Int. Field. Emission Symp. by Ernst (1982)10.1016/0304-3991(92)90150-I
/ Ultramicroscopy by Kreuzer (1992)
Dates
Type | When |
---|---|
Created | 22 years, 10 months ago (Oct. 16, 2002, 8:55 a.m.) |
Deposited | 6 years, 4 months ago (April 8, 2019, 5:25 a.m.) |
Indexed | 3 weeks, 5 days ago (July 28, 2025, 5:54 p.m.) |
Issued | 32 years, 4 months ago (April 1, 1993) |
Published | 32 years, 4 months ago (April 1, 1993) |
Published Print | 32 years, 4 months ago (April 1, 1993) |
@article{Schmid_1993, title={Combined electron and ion projection microscopy}, volume={67}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/0169-4332(93)90350-k}, DOI={10.1016/0169-4332(93)90350-k}, number={1–4}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Schmid, Heinz and Fink, Hans-Werner}, year={1993}, month=apr, pages={436–443} }