DOI: 10.1016/0169-4332(88)90066-9. Application of Auger electron spectroscopy and principal component analysis to the study of the Pd/c-Si and Pd/a-Si interfaces

Application of Auger electron spectroscopy and principal component analysis to the study of the Pd/c-Si and Pd/a-Si interfaces

10.1016/0169-4332(88)90066-9

Crossref journal-article

Elsevier BV

Applied Surface Science (78)

Bibliography

Vidal, R., & FerrÃ³n, J. (1988). Application of Auger electron spectroscopy and principal component analysis to the study of the Pd/c-Si and Pd/a-Si interfaces. Applied Surface Science, 31(2), 263â276.

Authors 2

R. Vidal (first)
J. Ferrón (additional)

References 24 Referenced 38

10.1116/1.570617 / J. Vacuum Sci. Technol. by Miller (1980)
10.1103/PhysRevB.23.6828 / Phys. Rev. by Nemanich (1981)
10.1103/PhysRevB.24.3354 / Phys. Rev. by Ottaviani (1981)
10.1063/1.92670 / Appl. Phys. Letters by Thompson (1981)
10.1116/1.570616 / J. Vacuum Sci. Technol. by Freeouf (1980)
10.1103/PhysRevB.23.4183 / Phys. Rev. by Rubloff (1981)
10.1116/1.571085 / J. Vacuum Sci. Technol. by Nemanich (1981)
10.1116/1.582592 / J. Vacuum Sci. Technol. by Nemanich (1983)
10.1016/0040-6090(82)90348-0 / Thin Solid Films by Eizenberg (1982)
10.1116/1.572574 / J. Vacuum Sci. Technol. by Matz (1984)
10.1002/pssa.2210620222 / Phys. Status Solidi by Atzrodt (1980)
10.1002/pssa.2210790220 / Phys. Status Solidi (a) by Atzrodt (1983)
10.1002/pssa.2210820205 / Phys. Status Solidi (a) by Atzrodt (1984)
10.1116/1.569759 / J. Vacuum Sci. Technol. by Roth (1978)
10.1016/0378-5963(81)90056-8 / Appl. Surface Sci. by Gaarenstroom (1981)
10.1116/1.571333 / J. Vacuum Sci. Technol. by Gaarenstroom (1982)
{'key': '10.1016/0169-4332(88)90066-9_BIB17', 'series-title': 'Factor Analysis in Chemistry', 'author': 'Malinowski', 'year': '1980'} / Factor Analysis in Chemistry by Malinowski (1980)
{'key': '10.1016/0169-4332(88)90066-9_BIB18', 'series-title': 'Geological Factor Analysis', 'author': 'Jöreskog', 'year': '1976'} / Geological Factor Analysis by Jöreskog (1976)
{'key': '10.1016/0169-4332(88)90066-9_BIB19', 'first-page': '2954', 'volume': '175', 'author': 'Hugus', 'year': '1971', 'journal-title': 'J. Phys. Chem.'} / J. Phys. Chem. by Hugus (1971)
10.1016/0039-6028(82)90080-2 / Surface Sci. by del Pennino (1982)
10.1103/PhysRevLett.46.782 / Phys. Rev. Letters. by Ho (1981)
10.1063/1.96230 / Appl. Phys. Letters by Hung (1985)
10.1063/1.334794 / J. Appl. Phys. by Ho (1985)
10.1016/0039-6028(83)90332-1 / Surface Sci. by Tromp (1983)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 16, 2002, 9:46 a.m.)
Deposited	6 years, 4 months ago (April 8, 2019, 3:59 a.m.)
Indexed	1 year, 10 months ago (Oct. 25, 2023, 5:08 p.m.)
Issued	37 years, 7 months ago (Feb. 1, 1988)
Published	37 years, 7 months ago (Feb. 1, 1988)
Published Print	37 years, 7 months ago (Feb. 1, 1988)

Funders 0

None

BibTeX

@article{Vidal_1988, title={Application of Auger electron spectroscopy and principal component analysis to the study of the Pd/c-Si and Pd/a-Si interfaces}, volume={31}, ISSN={0169-4332}, url={http://dx.doi.org/10.1016/0169-4332(88)90066-9}, DOI={10.1016/0169-4332(88)90066-9}, number={2}, journal={Applied Surface Science}, publisher={Elsevier BV}, author={Vidal, R. and Ferrón, J.}, year={1988}, month=feb, pages={263–276} }

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