Crossref
journal-article
Elsevier BV
Microelectronic Engineering (78)
References
7
Referenced
1
10.1116/1.583435
/ J. Vac. Sci. Technol. by Miyauchi (1986)10.1116/1.583867
/ J. Vac. Sci. Technol. by Morimoto (1987)10.1116/1.583373
/ J. Vac. Sci. Technol. by Melngailis (1986)10.1116/1.582719
/ J. Vac. Sci. Technol. by Komuro (1983)10.1103/PhysRevLett.49.57
/ Phys. Rev. Lett. by Binnig (1982)- Okano, M., Kajimura, K., Wakiyama, S., Sakai, F., Mizutani, W., and Ono M., J. Vac. Sci. Technol., (to be published)
10.1149/1.2119608
/ J. Electrochem. Soc. by Adachi (1983)
Dates
Type | When |
---|---|
Created | 22 years, 10 months ago (Oct. 16, 2002, 9:41 p.m.) |
Deposited | 6 years, 4 months ago (April 7, 2019, 6:57 a.m.) |
Indexed | 2 years, 3 months ago (May 15, 2023, 11:16 a.m.) |
Issued | 37 years, 9 months ago (Dec. 1, 1987) |
Published | 37 years, 9 months ago (Dec. 1, 1987) |
Published Print | 37 years, 9 months ago (Dec. 1, 1987) |
@article{Komuro_1987, title={Nanometer structure fabricated by FIB and its observation by STM}, volume={6}, ISSN={0167-9317}, url={http://dx.doi.org/10.1016/0167-9317(87)90058-x}, DOI={10.1016/0167-9317(87)90058-x}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Komuro, M. and Okayama, S. and Kitamura, O. and Mizutani, W. and Tokumoto, H. and Kajimura, K.}, year={1987}, month=dec, pages={343–348} }