DOI: 10.1016/0040-6090(95)06747-7. Artifacts in SPM measurements of thin films and coatings

Artifacts in SPM measurements of thin films and coatings

10.1016/0040-6090(95)06747-7

Crossref journal-article

Elsevier BV

Thin Solid Films (78)

Bibliography

Lenihan, T. G., Malshe, A. P., Brown, W. D., & Schaper, L. W. (1995). Artifacts in SPM measurements of thin films and coatings. Thin Solid Films, 270(1â2), 356â361.

Authors 4

T.G. Lenihan (first)
A.P. Malshe (additional)
W.D. Brown (additional)
L.W. Schaper (additional)

References 5 Referenced 11

{'key': '10.1016/0040-6090(95)06747-7_BIB1', 'series-title': 'Artifacts in SPM', 'year': '1993'} / Artifacts in SPM (1993)
{'key': '10.1016/0040-6090(95)06747-7_BIB2', 'series-title': 'How to Buy a Scanning Probe Microscope', 'year': '1993'} / How to Buy a Scanning Probe Microscope (1993)
10.1063/1.338189 / J. Appl. Phys. / Scanning tunneling microscopy by Hansma (1987)
{'key': '10.1016/0040-6090(95)06747-7_BIB4', 'first-page': '93', 'article-title': '7 ways to weed out artifacts in SPM images', 'author': 'Cassidy', 'year': '1994', 'journal-title': 'Res. Dev. Mag.'} / Res. Dev. Mag. / 7 ways to weed out artifacts in SPM images by Cassidy (1994)
10.1115/1.2927240 / J. Tribol. ASME Trans. by Ruan (1994)

Dates

Type	When
Created	22 years, 3 months ago (April 30, 2003, 9:37 p.m.)
Deposited	6 years, 3 months ago (April 28, 2019, 12:27 p.m.)
Indexed	2 weeks, 1 day ago (Aug. 7, 2025, 4:52 p.m.)
Issued	29 years, 8 months ago (Dec. 1, 1995)
Published	29 years, 8 months ago (Dec. 1, 1995)
Published Print	29 years, 8 months ago (Dec. 1, 1995)

Funders 0

None

BibTeX

@article{Lenihan_1995, title={Artifacts in SPM measurements of thin films and coatings}, volume={270}, ISSN={0040-6090}, url={http://dx.doi.org/10.1016/0040-6090(95)06747-7}, DOI={10.1016/0040-6090(95)06747-7}, number={1–2}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Lenihan, T.G. and Malshe, A.P. and Brown, W.D. and Schaper, L.W.}, year={1995}, month=dec, pages={356–361} }

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