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Thin Solid Films (78)
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Zalar, A., Hofmann, S., & Žabkar, A. (1985). Multiple-point depth profiling of multilayer Cr/Ni thin film structures on a rough substrate using scanning auger microscopy. Thin Solid Films, 131(1–2), 149–154.

Authors 3
  1. A. Zalar (first)
  2. S. Hofmann (additional)
  3. A. Žabkar (additional)
References 11 Referenced 40
  1. 10.1002/sia.740020406 / Surf. Interface Anal. by Hofmann (1980)
  2. 10.1016/0040-6090(76)90007-9 / Thin Solid Films by Mathieu (1976)
  3. 10.1016/0040-6090(77)90289-9 / Thin Solid Films by Hofmann (1977)
  4. 10.1002/sia.740050203 / Surf. Interface Anal. by Keenlyside (1983)
  5. 10.1016/0040-6090(81)90488-0 / Thin Solid Films by Seah (1981)
  6. 10.1016/0040-6090(81)90393-X / Thin Solid Films by Lea (1981)
  7. {'key': '10.1016/0040-6090(85)90384-0_BIB7', 'series-title': 'Proc. 9th Int. Vacuum Congr. and 5th Int. Conf. on Solid Surfaces', 'first-page': '134', 'author': 'Zalar', 'year': '1983'} / Proc. 9th Int. Vacuum Congr. and 5th Int. Conf. on Solid Surfaces by Zalar (1983)
  8. {'key': '10.1016/0040-6090(85)90384-0_BIB8', 'first-page': '225', 'volume': '8', 'author': 'Sager', 'year': '1971', 'journal-title': 'Vak.-Tech.'} / Vak.-Tech. by Sager (1971)
  9. {'key': '10.1016/0040-6090(85)90384-0_BIB9', 'first-page': '2613', 'volume': 'Vol. 3', 'author': 'Hofmann', 'year': '1977'} by Hofmann (1977)
  10. {'key': '10.1016/0040-6090(85)90384-0_BIB10', 'first-page': '115', 'volume': '45', 'author': 'Giber', 'year': '1984', 'journal-title': 'J. Phys. (Paris), Colloq. C2'} / J. Phys. (Paris), Colloq. C2 by Giber (1984)
  11. {'key': '10.1016/0040-6090(85)90384-0_BIB11', 'first-page': '141', 'volume': '37', 'author': 'Hofmann', 'year': '1984'} by Hofmann (1984)
Dates
Type When
Created 22 years, 10 months ago (Oct. 18, 2002, 6:05 p.m.)
Deposited 6 years, 5 months ago (April 5, 2019, 2:29 a.m.)
Indexed 1 month, 4 weeks ago (July 8, 2025, 4:41 p.m.)
Issued 40 years ago (Sept. 1, 1985)
Published 40 years ago (Sept. 1, 1985)
Published Print 40 years ago (Sept. 1, 1985)
Funders 0

None

@article{Zalar_1985, title={Multiple-point depth profiling of multilayer Cr/Ni thin film structures on a rough substrate using scanning auger microscopy}, volume={131}, ISSN={0040-6090}, url={http://dx.doi.org/10.1016/0040-6090(85)90384-0}, DOI={10.1016/0040-6090(85)90384-0}, number={1–2}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Zalar, A. and Hofmann, S. and Žabkar, A.}, year={1985}, month=sep, pages={149–154} }