Crossref
journal-article
Elsevier BV
Surface Science (78)
References
29
Referenced
127
10.1080/13642818908211190
/ Philos. Mag. by Mott (1989)10.1116/1.578054
/ J. Vac. Sci. Technol. A by Niwano (1992)10.1016/0039-6028(90)90671-T
/ Surf. Sci. by Aoto (1990)10.1016/0168-583X(89)90827-6
/ Nucl. Instrum. Methods B by Labunov (1989)10.1063/1.341072
/ J. Appl. Phys. by Feldman (1988)10.1016/0039-6028(87)90049-5
/ Surf. Sci. by Braun (1987)10.1103/PhysRevLett.43.1683
/ Phys. Rev. Lett. by Grunthaner (1979)10.1103/PhysRevB.28.3651
/ Phys. Rev. B by Hollinger (1983)10.1016/0039-6028(80)90578-6
/ Surf. Sci. by Bianconi (1980)10.1063/1.91036
/ Appl. Phys. Lett. by Adachi (1979)10.1103/PhysRevB.9.1951
/ Phys. Rev. B by Ibach (1974)10.1016/0039-6028(82)90011-5
/ Surf. Sci. by Derrien (1982)10.1016/0169-4332(89)90919-7
/ Appl. Surf. Sci. by Claassen (1989)10.1016/0038-1098(84)90292-8
/ Solid State Commun. by Nadamura (1984)10.1116/1.573833
/ J. Vac. Sci. Technol. A by Pai (1986)10.1063/1.444927
/ J. Chem. Phys. by Garofalini (1983)10.1016/0039-6028(90)90006-T
/ Surf. Sci. Lett. by Bermudez (1990)10.1016/0039-6028(85)90521-7
/ Surf. Sci. by Finster (1985)- X. Xu and D.W. Goodman, Appl. Phys. Lett., in press.
- X. Xu and D.W. Goodman, to be published.
10.1016/0009-2614(91)90110-U
/ Chem. Phys. Lett. by Wu (1991)- J.S. Corneille, J.W. He and D.W. Goodman, to be published.
10.1063/1.1142951
/ Rev. Sci. Instrum. by Campbell (1992)10.1116/1.575688
/ J. Vac. Sci. Technol. A by Grunze (1988)10.1116/1.568771
/ J. Vac. Sci. Technol. by Flitsch (1975)10.1016/0039-6028(88)90625-5
/ Surf. Sci. by Hochella (1988){'key': '10.1016/0039-6028(92)90748-U_BIB27', 'year': '1979'}
(1979){'key': '10.1016/0039-6028(92)90748-U_BIB28', 'series-title': 'The Physics of MOS Insulators', 'first-page': '202', 'author': 'Grant', 'year': '1980'}
/ The Physics of MOS Insulators by Grant (1980)10.1016/0167-5729(87)90007-0
/ Surf. Sci. Rep. by Egelhoff (1987)
Dates
Type | When |
---|---|
Created | 22 years, 10 months ago (Oct. 18, 2002, 8:58 a.m.) |
Deposited | 6 years, 4 months ago (April 5, 2019, 2:52 p.m.) |
Indexed | 1 year, 4 months ago (April 29, 2024, 7:57 a.m.) |
Issued | 32 years, 9 months ago (Dec. 1, 1992) |
Published | 32 years, 9 months ago (Dec. 1, 1992) |
Published Print | 32 years, 9 months ago (Dec. 1, 1992) |
@article{He_1992, title={X-ray photoelectron spectroscopic characterization of ultra-thin silicon oxide films on a Mo(100) surface}, volume={279}, ISSN={0039-6028}, url={http://dx.doi.org/10.1016/0039-6028(92)90748-u}, DOI={10.1016/0039-6028(92)90748-u}, number={1–2}, journal={Surface Science}, publisher={Elsevier BV}, author={He, J-W. and Xu, X. and Corneille, J.S. and Goodman, D.W.}, year={1992}, month=dec, pages={119–126} }