Crossref journal-article
Elsevier BV
Surface Science (78)
Bibliography

He, J.-W., Xu, X., Corneille, J. S., & Goodman, D. W. (1992). X-ray photoelectron spectroscopic characterization of ultra-thin silicon oxide films on a Mo(100) surface. Surface Science, 279(1–2), 119–126.

Authors 4
  1. J-W. He (first)
  2. X. Xu (additional)
  3. J.S. Corneille (additional)
  4. D.W. Goodman (additional)
References 29 Referenced 127
  1. 10.1080/13642818908211190 / Philos. Mag. by Mott (1989)
  2. 10.1116/1.578054 / J. Vac. Sci. Technol. A by Niwano (1992)
  3. 10.1016/0039-6028(90)90671-T / Surf. Sci. by Aoto (1990)
  4. 10.1016/0168-583X(89)90827-6 / Nucl. Instrum. Methods B by Labunov (1989)
  5. 10.1063/1.341072 / J. Appl. Phys. by Feldman (1988)
  6. 10.1016/0039-6028(87)90049-5 / Surf. Sci. by Braun (1987)
  7. 10.1103/PhysRevLett.43.1683 / Phys. Rev. Lett. by Grunthaner (1979)
  8. 10.1103/PhysRevB.28.3651 / Phys. Rev. B by Hollinger (1983)
  9. 10.1016/0039-6028(80)90578-6 / Surf. Sci. by Bianconi (1980)
  10. 10.1063/1.91036 / Appl. Phys. Lett. by Adachi (1979)
  11. 10.1103/PhysRevB.9.1951 / Phys. Rev. B by Ibach (1974)
  12. 10.1016/0039-6028(82)90011-5 / Surf. Sci. by Derrien (1982)
  13. 10.1016/0169-4332(89)90919-7 / Appl. Surf. Sci. by Claassen (1989)
  14. 10.1016/0038-1098(84)90292-8 / Solid State Commun. by Nadamura (1984)
  15. 10.1116/1.573833 / J. Vac. Sci. Technol. A by Pai (1986)
  16. 10.1063/1.444927 / J. Chem. Phys. by Garofalini (1983)
  17. 10.1016/0039-6028(90)90006-T / Surf. Sci. Lett. by Bermudez (1990)
  18. 10.1016/0039-6028(85)90521-7 / Surf. Sci. by Finster (1985)
  19. X. Xu and D.W. Goodman, Appl. Phys. Lett., in press.
  20. X. Xu and D.W. Goodman, to be published.
  21. 10.1016/0009-2614(91)90110-U / Chem. Phys. Lett. by Wu (1991)
  22. J.S. Corneille, J.W. He and D.W. Goodman, to be published.
  23. 10.1063/1.1142951 / Rev. Sci. Instrum. by Campbell (1992)
  24. 10.1116/1.575688 / J. Vac. Sci. Technol. A by Grunze (1988)
  25. 10.1116/1.568771 / J. Vac. Sci. Technol. by Flitsch (1975)
  26. 10.1016/0039-6028(88)90625-5 / Surf. Sci. by Hochella (1988)
  27. {'key': '10.1016/0039-6028(92)90748-U_BIB27', 'year': '1979'} (1979)
  28. {'key': '10.1016/0039-6028(92)90748-U_BIB28', 'series-title': 'The Physics of MOS Insulators', 'first-page': '202', 'author': 'Grant', 'year': '1980'} / The Physics of MOS Insulators by Grant (1980)
  29. 10.1016/0167-5729(87)90007-0 / Surf. Sci. Rep. by Egelhoff (1987)
Dates
Type When
Created 22 years, 10 months ago (Oct. 18, 2002, 8:58 a.m.)
Deposited 6 years, 4 months ago (April 5, 2019, 2:52 p.m.)
Indexed 1 year, 4 months ago (April 29, 2024, 7:57 a.m.)
Issued 32 years, 9 months ago (Dec. 1, 1992)
Published 32 years, 9 months ago (Dec. 1, 1992)
Published Print 32 years, 9 months ago (Dec. 1, 1992)
Funders 0

None

@article{He_1992, title={X-ray photoelectron spectroscopic characterization of ultra-thin silicon oxide films on a Mo(100) surface}, volume={279}, ISSN={0039-6028}, url={http://dx.doi.org/10.1016/0039-6028(92)90748-u}, DOI={10.1016/0039-6028(92)90748-u}, number={1–2}, journal={Surface Science}, publisher={Elsevier BV}, author={He, J-W. and Xu, X. and Corneille, J.S. and Goodman, D.W.}, year={1992}, month=dec, pages={119–126} }