Crossref journal-article
Elsevier BV
Surface Science (78)
Bibliography

Konomi, I., Kawano, A., & Kido, Y. (1989). Damage profiling of Ar+ -irradiated Si(100) and GaAs(100) by medium energy ion scattering. Surface Science, 207(2–3), 427–440.

Authors 3
  1. I. Konomi (first)
  2. A. Kawano (additional)
  3. Y. Kido (additional)
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Dates
Type When
Created 22 years, 10 months ago (Oct. 18, 2002, 9:45 a.m.)
Deposited 6 years, 4 months ago (April 5, 2019, 11:55 a.m.)
Indexed 1 year, 6 months ago (Feb. 4, 2024, 5:58 a.m.)
Issued 36 years, 7 months ago (Jan. 1, 1989)
Published 36 years, 7 months ago (Jan. 1, 1989)
Published Print 36 years, 7 months ago (Jan. 1, 1989)
Funders 0

None

@article{Konomi_1989, title={Damage profiling of Ar+ -irradiated Si(100) and GaAs(100) by medium energy ion scattering}, volume={207}, ISSN={0039-6028}, url={http://dx.doi.org/10.1016/0039-6028(89)90133-7}, DOI={10.1016/0039-6028(89)90133-7}, number={2–3}, journal={Surface Science}, publisher={Elsevier BV}, author={Konomi, I. and Kawano, A. and Kido, Y.}, year={1989}, month=jan, pages={427–440} }