DOI: 10.1016/0039-6028(86)90321-3. A new LEED instrument for quantitative spot profile analysis

A new LEED instrument for quantitative spot profile analysis

10.1016/0039-6028(86)90321-3

Crossref journal-article

Elsevier BV

Surface Science (78)

Bibliography

Scheithauer, U., Meyer, G., & Henzler, M. (1986). A new LEED instrument for quantitative spot profile analysis. Surface Science, 178(1â3), 441â451.

Authors 3

U. Scheithauer (first)
G. Meyer (additional)
M. Henzler (additional)

References 15 Referenced 284

{'key': '10.1016/0039-6028(86)90321-3_BIB1', 'article-title': 'Surface Crystallography by LEED', 'volume': 'Vol. 2', 'author': 'Van Hove', 'year': '1979'} / Surface Crystallography by LEED by Van Hove (1979)
{'key': '10.1016/0039-6028(86)90321-3_BIB2', 'first-page': '92', 'article-title': 'The Structure of Surfaces', 'volume': 'Vol. 2', 'author': 'Jona', 'year': '1985'} / The Structure of Surfaces by Jona (1985)
10.1016/0039-6028(85)90511-4 / Surface Sci. by Henzler (1985)
10.1016/0378-5963(82)90031-9 / Appl. Surface Sci. by Lagally (1982)
10.1016/0039-6028(82)90498-8 / Surface Sci. by Gronwald (1982)
{'key': '10.1016/0039-6028(86)90321-3_BIB6', 'author': 'Gronwald', 'year': '1981', 'journal-title': 'PhD Thesis'} / PhD Thesis by Gronwald (1981)
{'key': '10.1016/0039-6028(86)90321-3_BIB7', 'author': 'Wulfert', 'year': '1982', 'journal-title': 'PhD Thesis'} / PhD Thesis by Wulfert (1982)
10.1063/1.1137259 / Rev. Sci. Instrum. by Lagally (1983)
10.1063/1.1138423 / Rev. Sci. Instrum. by McRae (1985)
{'key': '10.1016/0039-6028(86)90321-3_BIB10', 'first-page': '105', 'volume': 'Vol. 2', 'author': 'Müller', 'year': '1985'} by Müller (1985)
10.1088/0508-3443/9/12/305 / Brit. J. Appl. Phys. by Haine (1958)
10.1016/0039-6028(70)90228-1 / Surface Sci. by Houston (1970)
10.1016/0378-5963(82)90092-7 / Appl. Surface Sci. by Henzler (1982)
10.1016/0039-6028(72)90069-6 / Surface Sci. by Henrion (1972)
{'key': '10.1016/0039-6028(86)90321-3_BIB15', 'first-page': '2059', 'volume': 'D11', 'author': 'Rawlings', 'year': '1978', 'journal-title': 'J. Phys.'} / J. Phys. by Rawlings (1978)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 9:46 a.m.)
Deposited	6 years, 5 months ago (April 5, 2019, 12:57 p.m.)
Indexed	3 days, 4 hours ago (Sept. 3, 2025, 6:26 a.m.)
Issued	38 years, 9 months ago (Dec. 1, 1986)
Published	38 years, 9 months ago (Dec. 1, 1986)
Published Print	38 years, 9 months ago (Dec. 1, 1986)

Funders 0

None

BibTeX

@article{Scheithauer_1986, title={A new LEED instrument for quantitative spot profile analysis}, volume={178}, ISSN={0039-6028}, url={http://dx.doi.org/10.1016/0039-6028(86)90321-3}, DOI={10.1016/0039-6028(86)90321-3}, number={1–3}, journal={Surface Science}, publisher={Elsevier BV}, author={Scheithauer, U. and Meyer, G. and Henzler, M.}, year={1986}, month=dec, pages={441–451} }

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