DOI: 10.1016/0039-6028(85)90521-7. Interpretation of XPS core level shifts and structure of thin silicon oxide layers

Interpretation of XPS core level shifts and structure of thin silicon oxide layers

10.1016/0039-6028(85)90521-7

Crossref journal-article

Elsevier BV

Surface Science (78)

Bibliography

Finster, J., Schulze, D., Bechstedt, F., & Meisel, A. (1985). Interpretation of XPS core level shifts and structure of thin silicon oxide layers. Surface Science, 152â153, 1063â1070.

Authors 4

J. Finster (first)
D. Schulze (additional)
F. Bechstedt (additional)
A. Meisel (additional)

References 20 Referenced 73

An extended presentation of these results including model calculations will be published: J. Finster, D. Schulze and F. Bechstedt, part I; F. Bechstedt, J. Finster and D. Schulze, part II.
10.1147/rd.223.0294 / IBM J. Res. Develop. by Raider (1978)
10.1103/PhysRevLett.43.1683 / Phys. Rev. Letters by Grunthaner (1979)
10.1116/1.570194 / J. Vacuum Sci. Technol. by Chen (1979)
{'key': '10.1016/0039-6028(85)90521-7_BIB5_1', 'author': 'Hollinger', 'year': '1979', 'journal-title': 'Thesis'} / Thesis by Hollinger (1979)
10.1016/0378-5963(81)90126-4 / Appl. Surface Sci. by Hollinger (1981)
10.1016/0039-6028(79)90142-0 / Surface Sci. by Ishizaka (1979)
10.1002/pssa.2210420211 / Phys. Status Solidi (a) by Hübner (1977)
10.1002/pssb.2220910117 / Phys. Status Solidi (b) by Bechstedt (1979)
10.1016/0039-6028(79)90647-2 / Surface Sci. by Hirsch (1979)
10.1002/pssa.2210680221 / Phys. Status Solidi (a) by Finster (1981)
{'key': '10.1016/0039-6028(85)90521-7_BIB11', 'first-page': '11', 'volume': '14', 'author': 'Schulze', 'year': '1983', 'journal-title': 'Physik der Halbleiteroberfläche'} / Physik der Halbleiteroberfläche by Schulze (1983)
10.1016/0039-6028(83)90388-6 / Surface Sci. by Mende (1983)
{'key': '10.1016/0039-6028(85)90521-7_BIB13', 'first-page': '293', 'volume': '15', 'author': 'Mende', 'year': '1984', 'journal-title': 'Physik der Halbleiteroberfläche'} / Physik der Halbleiteroberfläche by Mende (1984)
10.1002/pssa.2210760153 / Phys. Status Solidi (a) by Schulze (1983)
10.1002/pssa.2210670221 / Phys. Status Solidi (a) by Bechstedt (1981)
10.1103/PhysRevB.19.3944 / Phys. Rev. by Garner (1979)
{'key': '10.1016/0039-6028(85)90521-7_BIB17', 'series-title': 'Emission Properties of Materials', 'author': 'Fomenko', 'year': '1982'} / Emission Properties of Materials by Fomenko (1982)
{'key': '10.1016/0039-6028(85)90521-7_BIB18', 'series-title': 'Abstracts of the Intern. Conf. on X-Ray and Atomic Inner-Shell Physics (X 82), Eugen, OR', 'first-page': '66', 'author': 'Finster', 'year': '1982'} / Abstracts of the Intern. Conf. on X-Ray and Atomic Inner-Shell Physics (X 82), Eugen, OR by Finster (1982)
10.1002/pssa.2210520222 / Phys. Status Solidi (a) by Hübner (1979)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 6:34 a.m.)
Deposited	6 years, 4 months ago (April 5, 2019, 7:52 a.m.)
Indexed	3 hours, 41 minutes ago (Aug. 29, 2025, 5:56 a.m.)
Issued	40 years, 4 months ago (April 1, 1985)
Published	40 years, 4 months ago (April 1, 1985)
Published Print	40 years, 4 months ago (April 1, 1985)

Funders 0

None

BibTeX

@article{Finster_1985, title={Interpretation of XPS core level shifts and structure of thin silicon oxide layers}, volume={152–153}, ISSN={0039-6028}, url={http://dx.doi.org/10.1016/0039-6028(85)90521-7}, DOI={10.1016/0039-6028(85)90521-7}, journal={Surface Science}, publisher={Elsevier BV}, author={Finster, J. and Schulze, D. and Bechstedt, F. and Meisel, A.}, year={1985}, month=apr, pages={1063–1070} }

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