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Elsevier BV
Surface Science (78)
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Derrie, J., & Commandré, M. (1982). SiO2 ultra thin film growth kinetics as investigated by surface techniques. Surface Science, 118(1–2), 32–46.

Authors 2
  1. J. Derrie (first)
  2. M. Commandré (additional)
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Dates
Type When
Created 22 years, 10 months ago (Oct. 18, 2002, 10:34 a.m.)
Deposited 6 years, 5 months ago (April 5, 2019, 10:27 a.m.)
Indexed 1 year, 6 months ago (Feb. 10, 2024, 6:39 p.m.)
Issued 43 years, 3 months ago (June 1, 1982)
Published 43 years, 3 months ago (June 1, 1982)
Published Print 43 years, 3 months ago (June 1, 1982)
Funders 0

None

@article{Derrie_1982, title={SiO2 ultra thin film growth kinetics as investigated by surface techniques}, volume={118}, ISSN={0039-6028}, url={http://dx.doi.org/10.1016/0039-6028(82)90011-5}, DOI={10.1016/0039-6028(82)90011-5}, number={1–2}, journal={Surface Science}, publisher={Elsevier BV}, author={Derrie, J. and Commandré, M.}, year={1982}, month=jun, pages={32–46} }