DOI: 10.1016/0039-6028(75)90347-7. A first order approximation to quantitative auger analysis in the range 100 to 1000eV using the CMA analyzer

A first order approximation to quantitative auger analysis in the range 100 to 1000eV using the CMA analyzer

10.1016/0039-6028(75)90347-7

Crossref journal-article

Elsevier BV

Surface Science (78)

Bibliography

Morabito, J. M. (1975). A first order approximation to quantitative auger analysis in the range 100 to 1000eV using the CMA analyzer. Surface Science, 49(1), 318â324.

Authors 1

J.M. Morabito (first)

References 16 Referenced 45

{'key': '10.1016/0039-6028(75)90347-7_BIB1', 'author': 'Castaing', 'year': '1951'} by Castaing (1951)
10.1063/1.1657051 / J. Appl. Phys. by Weber (1969)
10.1016/0039-6028(74)90141-1 / Surface Sci. by Grant (1974)
From a plot of literature escape depth values prepared by J.C. Tsacy, General Motors Research Laboratories (1973).
10.1016/0039-6028(72)90209-9 / Surface Sci. by Meyer (1972)
{'key': '10.1016/0039-6028(75)90347-7_BIB6', 'first-page': '563', 'volume': '88', 'author': 'Rudge', 'year': '1966'} by Rudge (1966)
{'key': '10.1016/0039-6028(75)90347-7_BIB7', 'first-page': '3', 'author': 'Palmberg', 'year': '1972'} by Palmberg (1972)
10.1016/0040-6090(73)90022-9 / Thin Solid Films by Morabito (1973)
10.1021/ac60338a026 / Anal. Chem. Col. by Morabito (1974)
{'key': '10.1016/0039-6028(75)90347-7_BIB10', 'first-page': '1', 'volume': '33', 'author': 'Lindhard', 'year': '1963', 'journal-title': 'Kgl. Danske Videnskab. Selskab, Mat. Fys. Medd.'} / Kgl. Danske Videnskab. Selskab, Mat. Fys. Medd. by Lindhard (1963)
10.1016/0039-6028(72)90220-8 / Surface Sci. by Morabito (1972)
{'key': '10.1016/0039-6028(75)90347-7_BIB12', 'series-title': 'Ion Implantation in Semiconductors and Other Materials', 'first-page': '89', 'author': 'Tsai', 'year': '1973'} / Ion Implantation in Semiconductors and Other Materials by Tsai (1973)
{'key': '10.1016/0039-6028(75)90347-7_BIB13', 'series-title': 'Proc. of 4th Intern. Conf. on Ion Implantation in Semiconductors and Other Materials', 'author': 'Tsai', 'year': '1974'} / Proc. of 4th Intern. Conf. on Ion Implantation in Semiconductors and Other Materials by Tsai (1974)
{'key': '10.1016/0039-6028(75)90347-7_BIB14', 'first-page': '549A', 'volume': '45', 'author': 'Palmberg', 'year': '1973', 'journal-title': 'Anal. Chem.'} / Anal. Chem. by Palmberg (1973)
The Cu2O single crystal was supplied by H. Bennett, National Bureau of Standards, Washington, D.C.
10.1063/1.1661352 / J. Appl. Phys. by Dahlgren (1972)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 11:23 a.m.)
Deposited	6 years, 4 months ago (April 5, 2019, 9:53 a.m.)
Indexed	1 month, 2 weeks ago (July 8, 2025, 3:42 p.m.)
Issued	50 years, 4 months ago (April 1, 1975)
Published	50 years, 4 months ago (April 1, 1975)
Published Print	50 years, 4 months ago (April 1, 1975)

Funders 0

None

BibTeX

@article{Morabito_1975, title={A first order approximation to quantitative auger analysis in the range 100 to 1000eV using the CMA analyzer}, volume={49}, ISSN={0039-6028}, url={http://dx.doi.org/10.1016/0039-6028(75)90347-7}, DOI={10.1016/0039-6028(75)90347-7}, number={1}, journal={Surface Science}, publisher={Elsevier BV}, author={Morabito, J.M.}, year={1975}, month=apr, pages={318–324} }

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