DOI: 10.1016/0039-6028(73)90107-6. Auger electron spectroscopy as a tool for measuring the diffusion of foreign atoms in solids near their surface

Auger electron spectroscopy as a tool for measuring the diffusion of foreign atoms in solids near their surface

10.1016/0039-6028(73)90107-6

Crossref journal-article

Elsevier BV

Surface Science (78)

Bibliography

Sparnaay, M. J., van Bommel, A. J., & van Tooren, A. (1973). Auger electron spectroscopy as a tool for measuring the diffusion of foreign atoms in solids near their surface. Surface Science, 39(1), 251â254.

Authors 3

M.J. Sparnaay (first)
A.J. van Bommel (additional)
A. van Tooren (additional)

References 2 Referenced 7

10.1016/0039-6028(71)90210-X / Surface Sci. by Chang (1971)
10.1016/0039-6028(71)90162-2 / Surface Sci. by Netten (1971)

Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 7:23 a.m.)
Deposited	6 years, 5 months ago (April 5, 2019, 5:24 a.m.)
Indexed	2 years, 4 months ago (April 6, 2023, 4:13 a.m.)
Issued	52 years, 1 month ago (Aug. 1, 1973)
Published	52 years, 1 month ago (Aug. 1, 1973)
Published Print	52 years, 1 month ago (Aug. 1, 1973)

Funders 0

None

BibTeX

@article{Sparnaay_1973, title={Auger electron spectroscopy as a tool for measuring the diffusion of foreign atoms in solids near their surface}, volume={39}, ISSN={0039-6028}, url={http://dx.doi.org/10.1016/0039-6028(73)90107-6}, DOI={10.1016/0039-6028(73)90107-6}, number={1}, journal={Surface Science}, publisher={Elsevier BV}, author={Sparnaay, M.J. and van Bommel, A.J. and van Tooren, A.}, year={1973}, month=aug, pages={251–254} }

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