DOI: 10.1016/0038-1101(88)90128-1. Circuit technique for semiconductor-device analysis with junction diode open circuit voltage decay example

Circuit technique for semiconductor-device analysis with junction diode open circuit voltage decay example

10.1016/0038-1101(88)90128-1

Crossref journal-article

Elsevier BV

Solid-State Electronics (78)

Bibliography

Lindholm, F. A., & Sah, C. T. (1988). Circuit technique for semiconductor-device analysis with junction diode open circuit voltage decay example. Solid-State Electronics, 31(2), 197â204.

Authors 2

Fredrik A. Lindholm (first)
C.Tang Sah (additional)

References 51 Referenced 8

10.1109/PROC.1967.5630 / Proc. IEEE by Sah (1967)
10.1109/PROC.1967.5631 / Proc. IEEE by Sah (1967)
10.1016/0038-1101(70)90035-3 / Solid-St. Electron. by Sah (1970)
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{'key': '10.1016/0038-1101(88)90128-1_BIB15', 'first-page': '202', 'volume': 'ED-21', 'author': 'Sah', 'year': '1974', 'journal-title': 'IEEE Trans.'} / IEEE Trans. by Sah (1974)
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10.1063/1.88175 / Appl. Phys. Letts. by McNutt (1975)
10.1016/0038-1101(76)90171-4 / Solid-St. Electron. by McNutt (1976)
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Dates

Type	When
Created	22 years, 10 months ago (Oct. 18, 2002, 4:14 a.m.)
Deposited	6 years, 4 months ago (April 5, 2019, 3:56 p.m.)
Indexed	3 years, 4 months ago (April 2, 2022, 9:44 p.m.)
Issued	37 years, 6 months ago (Feb. 1, 1988)
Published	37 years, 6 months ago (Feb. 1, 1988)
Published Print	37 years, 6 months ago (Feb. 1, 1988)

Funders 0

None

BibTeX

@article{Lindholm_1988, title={Circuit technique for semiconductor-device analysis with junction diode open circuit voltage decay example}, volume={31}, ISSN={0038-1101}, url={http://dx.doi.org/10.1016/0038-1101(88)90128-1}, DOI={10.1016/0038-1101(88)90128-1}, number={2}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Lindholm, Fredrik A. and Sah, C.Tang}, year={1988}, month=feb, pages={197–204} }

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