Crossref
journal-article
Elsevier BV
Solid-State Electronics (78)
References
18
Referenced
50
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Dates
Type | When |
---|---|
Created | 22 years, 10 months ago (Oct. 18, 2002, 4:14 a.m.) |
Deposited | 6 years, 5 months ago (April 5, 2019, 3:55 p.m.) |
Indexed | 4 months, 2 weeks ago (April 20, 2025, 12:30 a.m.) |
Issued | 37 years, 8 months ago (Jan. 1, 1988) |
Published | 37 years, 8 months ago (Jan. 1, 1988) |
Published Print | 37 years, 8 months ago (Jan. 1, 1988) |
@article{Sasaki_1988, title={A new experimental determination of the relationship between the Hall mobility and the hole concentration in heavily doped p-type silicon}, volume={31}, ISSN={0038-1101}, url={http://dx.doi.org/10.1016/0038-1101(88)90079-2}, DOI={10.1016/0038-1101(88)90079-2}, number={1}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Sasaki, Y. and Itoh, K. and Inoue, E. and Kishi, S. and Mitsuishi, T.}, year={1988}, month=jan, pages={5–12} }