Crossref
journal-article
Elsevier BV
Solid-State Electronics (78)
References
16
Referenced
186
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Dates
Type | When |
---|---|
Created | 22 years, 10 months ago (Oct. 18, 2002, 12:15 a.m.) |
Deposited | 6 years, 5 months ago (April 5, 2019, 11:54 a.m.) |
Indexed | 1 week ago (Aug. 30, 2025, 12:24 p.m.) |
Issued | 50 years, 9 months ago (Dec. 1, 1974) |
Published | 50 years, 9 months ago (Dec. 1, 1974) |
Published Print | 50 years, 9 months ago (Dec. 1, 1974) |
@article{Chwang_1974, title={Contact size effects on the van der Pauw method for resistivity and Hall coefficient measurement}, volume={17}, ISSN={0038-1101}, url={http://dx.doi.org/10.1016/0038-1101(74)90001-x}, DOI={10.1016/0038-1101(74)90001-x}, number={12}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Chwang, Ronald and Smith, B.J. and Crowell, C.R.}, year={1974}, month=dec, pages={1217–1227} }