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Elsevier BV
Solid-State Electronics (78)
Bibliography

Chwang, R., Smith, B. J., & Crowell, C. R. (1974). Contact size effects on the van der Pauw method for resistivity and Hall coefficient measurement. Solid-State Electronics, 17(12), 1217–1227.

Authors 3
  1. Ronald Chwang (first)
  2. B.J. Smith (additional)
  3. C.R. Crowell (additional)
References 16 Referenced 186
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Dates
Type When
Created 22 years, 10 months ago (Oct. 18, 2002, 12:15 a.m.)
Deposited 6 years, 5 months ago (April 5, 2019, 11:54 a.m.)
Indexed 1 week ago (Aug. 30, 2025, 12:24 p.m.)
Issued 50 years, 9 months ago (Dec. 1, 1974)
Published 50 years, 9 months ago (Dec. 1, 1974)
Published Print 50 years, 9 months ago (Dec. 1, 1974)
Funders 0

None

@article{Chwang_1974, title={Contact size effects on the van der Pauw method for resistivity and Hall coefficient measurement}, volume={17}, ISSN={0038-1101}, url={http://dx.doi.org/10.1016/0038-1101(74)90001-x}, DOI={10.1016/0038-1101(74)90001-x}, number={12}, journal={Solid-State Electronics}, publisher={Elsevier BV}, author={Chwang, Ronald and Smith, B.J. and Crowell, C.R.}, year={1974}, month=dec, pages={1217–1227} }